To overcome the limit of diffraction while achieving the superresolution technique, solid immersion lenses are the key optical elements for data storage and nanophotonics applications. Recent demonstrations have shown how different nanostructures (such as elliptical SILs) are used in diverse fields of increasing resolution in the presence of a structured Gaussian beam. By applying twisted beams such as angular momentum beams (Laguerre- Gaussian) and spatial higher-order Gaussian beams (Hermite- Gauss), we can attain a sharp (FWHM = 27 nm) near-field focal spot pattern, which is considerably better than the conventional macroscopic SIL. By numerical simulations, tolerance has been confirmed with a slight variation in beam size and geometrical modification to make the model compatible with fabrication errors. This narrow bandwidth intensity distribution can be utilized for scanning the sample with higher resolution, especially in the field of quantum technology.
To overcome the limit of diffraction while achieving the superresolution technique, solid immersion lenses are the key optical elements for data storage and nanophotonics applications. Recent demonstrations have shown how different nanostructures (such as elliptical SILs) are used in diverse fields of increasing resolution in the presence of a structured Gaussian beam. By applying twisted beams such as angular momentum beams (Laguerre- Gaussian) and spatial higher-order Gaussian beams (Hermite- Gauss), we can attain a sharp (FWHM = 27 nm) near-field focal spot pattern, which is considerably better than the conventional macroscopic SIL. By numerical simulations, tolerance has been confirmed with a slight variation in beam size and geometrical modification to make the model compatible with fabrication errors. This narrow bandwidth intensity distribution can be utilized for scanning the sample with higher resolution, especially in the field of quantum technology.
The resolution of imaging devices is ultimately limited by the diffraction of light. This limit can be circumvented by exploiting near-field phenomena, non-linearities of the sample or specific illumination schemes, which led to the recent explosion of optical super-resolution techniques. However, it would be desirable to reach the nanoscale in the most general way possible, with far-field linear imaging of uniformly illuminated samples. In the last few years, the answer to that came with the field of quantum-inspired super-resolution (QISR), where quantum metrological techniques were used to find novel measurement schemes that, beyond the conventional direct imaging of light, would achieve higher precisions. Interestingly, these ideas would always in some way or another involve transverse spatial modes of light. This thesis presents our work on the subject, with novel theoretical and experimental results. Firstly, we develop the traditional theory of QISR, with has mostly focused on either the estimation of separation of two point sources or on geometric moments of samples. Then, we introduce our own results on optical imaging of general distributions of point sources, in a step to take QISR from toy examples to real imaging scenarios. Secondly, we apply all the concepts studied on a experimental, proof-of-principle implementation of a QISR scheme dubbed Hermite-Gaussian Microscopy (HGM), which uses heterodyne detection with several Hermite-Gaussian modes as local oscillator in order to reconstruct the object sample and achieve super-resolution. We report the techniques necessary for the manipulation of spatial modes of light, as well as our results, where we demonstrated 2D imaging with twofold resolution enhancement beyond the diffraction limit.
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern superresolution microscopy techniques employ active interaction with the object by exploiting its optical nonlinearities, nonclassical properties of the illumination beam, or near field probing. Thus, they are not applicable whenever such interaction is not possible, for example, in astronomy or noninvasive biological imaging. Far field, linear optical superresolution techniques based on passive analysis of light coming from the object would cover these gaps. In this Letter, we present the first proof-of-principle demonstration of such a technique for 2D imaging. It works by accessing information about spatial correlations of the image optical field and, hence, about the object itself via measuring projections onto Hermite-Gaussian transverse spatial modes. With a basis of 21 spatial modes in both transverse dimensions, we perform two-dimensional imaging with twofold resolution enhancement beyond the diffraction limit.
Optical monitoring of object position and alignment with nanoscale precision is critical for ultra-precision measurement applications, such as micro/nano-fabrication, weak force sensing, and microscopic imaging. Traditional optical nanometry methods often rely on precision nanostructure fabrication, multi-beam interferometry , or complex post-processing algorithms, which can limit their practical use. In this study, we introduced a simplified and robust quantum measurement technique with an achievable resolution of 2.2 pm and an experimental demonstration of 1 nm resolution, distinguishing it from conventional interferometry , which depended on multiple reference beams. We designed a metasurface substrate with a mode-conversion function, in which an incident Gaussian beam is converted into higher-order transverse electromagnetic mode (TEM) modes. A theoretical analysis, including calculations of the Fisher information , demonstrated that the accuracy was maintained for nanoscale displacements. In conclusion, the study findings provide a new approach for precise alignment and metrology of nanofabrication and other advanced applications.
We propose to use intensity correlation microscopy in combination with structured illumination to image quantum emitters that exhibit antibunching with a spatial resolution reaching far beyond the Rayleigh limit. Combining intensity measurements and intensity auto correlations up to order m creates an effective PSF with FWHM shrunk by the factor m. Structured Illumination microscopy on the other hand introduces a resolution improvement of factor 2 by use of the principle of moiré fringes. Here, we show that for linear low-intensity excitation and linear optical detection the simultaneous use of both techniques leads to an in theory unlimited resolution power with the improvement scaling favorably as m+m in dependence of the correlation order m. Hence, yielding this technique to be of interest in microscopy for imaging a variety of samples including biological ones. We present the underlying theory and simulations demonstrating the highly increased spatial superresolution, and point out requirements for an experimental implementation.
The resolution of traditional optical microscope and optical lithography is limited by about half wavelength of the light source, which is well known as the diffraction limit or Abbe limit. The resolution limit is due to the missing of high spatial frequency components in the far-field. One way to achieve high resolution is to move the detector into the near-field region where the evanescent wave can be collected. However, these methods are surface-bound and usually very slow which have limited applications. It has long been an interesting and important question about how to overcome the diffraction limit in the far-field.\n\nFor optical lithography, a number of methods have been proposed to overcome the diffraction limit such as multi-photon scanning, quantum entanglement, quantum inspired process (e.g., dopperlon), and quantum dark state. However, these methods either require multi-photon absorber, quantum entanglement, or multi-energy levels, which restrict them from extending to higher resolution in practice. In this thesis, we showed that sub-diffraction-limited resolution can be generated by the coherent Rabi gradient. This method does not require multi-photon absorber or quantum entanglement but just quantum coherence of the medium. Extension from lower resolution to higher resolution is very straightforward where we just need to increase the pulse intensity or pulse duration. We also proposed two atom lithography experiments based on the Rabi gradient. The first one uses Rubidium Rydberg atom and microwave where we showed that sub-micrometer line spacing is possible. The second one uses Chromium atom and optical field where we showed that sub-10nm line spacing is possible while the wavelength of the light is about 400nm.\n\nFor optical imaging, a number of methods have also been proposed to achieve super-resolution such as multi-photon microscope, stimulated-emission-depletion, structured illumination microscopy, centroid-based techniques and metamaterial-based lens. Here, we will show a new method to achieve resolution beyond the diffraction limit which we called it resonance fluorescence microscopy. Resonance fluorescence has been proposed to localize a single atom with resolution beyond the diffraction limit. The separation between two atoms can also be extracted from the resonance\nfluorescence spectrum. To develop it as microscopy, we need to evaluate the resonance fluorescence spectrum of multiple-atom system. We analytically solved the general feature of the spectrum when the Rabi frequency is much larger than the dipole-dipole interaction and showed how to extract the spatial information of the atoms with resolution far beyond the diffraction limit. This method is entirely based on far-field techniques and it does not require point-by-point scanning.
Super-resolution microscopy is crucial for imaging sub-wavelength biological structures. However, most techniques rely on nonlinear saturation or stochastic switching of emitters, limiting imaging speed and increasing phototoxicity. Here, we achieve deep super-resolution without employing saturation or stochastic dynamics, instead using a form of spatial mode demultiplexing. By shaping the point-spread function of the emitted light, our Structured Detection Microscope (SDM) redistributes information away from high shot-noise regions of the image, enhancing sensitivity to sub-diffraction emitter separations in two-dimensions and without mode-sorting optics. Implementing SDM within a high-numerical aperture total internal reflection fluorescence microscope, we demonstrate imaging of fluorophores attached to DNA nanorulers with separations as small as 50 nm at resolutions surpassing 40 nm - fivefold below the diffraction limit. This shows that spatial mode demultiplexing can achieve far sub-wavelength resolution and is applicable to biologically relevant samples. By enabling super-resolution biomolecular imaging without emitter saturation and stochasticity, our work opens the door to better understanding biological structure, function and dynamics.