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arXiv:2601.08088

Multi-level charge fluctuations in a Si/SiGe double quantum dot device

Dylan Albrecht, Feiyang Ye, N. Tobias Jacobson, John M. Nichol

cond-mat.mes-hallquant-phSubmitted Jan 13, 2026• Announced Jan 14, 2026
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Abstract

Discrete charge fluctuations, routinely observed in semiconductor quantum dot devices, may contribute significantly to device drift and errors resulting from qubit miscalibration. Understanding the nature and origins of these discrete charge fluctuations may provide insights into material improvements or means of mitigating charge noise in semiconductor quantum dot devices. In this work, we measure multi-level charge fluctuations present in a Si/SiGe double quantum dot device over a range of device operating voltages and temperatures. To characterize the parameter-dependent dynamics of the underlying fluctuating degrees of freedom, we perform a detailed analysis of the measured noise timeseries. We perform algorithmically assisted drift detection and change point detection to detrend the data and remove a slow fluctuator component, as a preprocessing step. We perform model comparison on the post-processed time series between different $n$-level fluctuator ($n$LF) factorial hidden Markov models (FHMMs), finding that although at most sweep values the independent pair of 2LFs model would be preferred, in a particular region of voltage space the 4LF model outperforms the other models, indicating a conditional rate dependence between the two fluctuators. By tracking fluctuator transition rates, biases, and weights over a range of different device configurations, we estimate gate voltage and conductivity sensitivity. In particular, we fit a phenomenological, detailed balance model to the extracted independent 2LFs rate data, yielding lever arm estimates in the range of $-2 μ$eV/mV up to $4 μ$eV/mV between the two 2LFs and nearby gate electrodes. We expect that these characterization results may aid in subsequent spatial triangulation of the charge fluctuators.

Comments
15 pages, 13 figures

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Discrete charge fluctuations, routinely observed in semiconductor quantum dot devices, may contribute significantly to device drift and errors resulting from qubit miscalibration. Understanding the nature and origins of these discrete charge fluctuations may provide insights into material improvements or means of mitigating charge noise in semiconductor quantum dot devices. In this work, we measure multi-level charge fluctuations present in a Si/SiGe double quantum dot device over a range of device operating voltages and temperatures. To characterize the parameter-dependent dynamics of the underlying fluctuating degrees of freedom, we perform a detailed analysis of the measured noise timeseries. We perform algorithmically assisted drift detection and change point detection to detrend the data and remove a slow fluctuator component, as a preprocessing step. We perform model comparison on the post-processed time series between different nnn-level fluctuator (nnnLF) factorial hidden Markov models (FHMMs), finding that although at most sweep values the independent pair of 2LFs model would be preferred, in a particular region of voltage space the 4LF model outperforms the other models, indicating a conditional rate dependence between the two fluctuators. By tracking fluctuator transition rates, biases, and weights over a range of different device configurations, we estimate gate voltage and conductivity sensitivity. In particular, we fit a phenomenological, detailed balance model to the extracted independent 2LFs rate data, yielding lever arm estimates in the range of −2μ-2 μ−2μeV/mV up to 4μ4 μ4μeV/mV between the two 2LFs and nearby gate electrodes. We expect that these characterization results may aid in subsequent spatial triangulation of the charge fluctuators.
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Cross-correlated charge noise in silicon quantum dots has emerged as an important issue for fault-tolerant quantum computation, as it has been suggested to both limit quantum error correction performance and reveal unique information about noise sources. We develop a method to characterize charge noise cross-correlations in a semiconductor qubit device based solely on quantum-dot transport current. By dynamically switching the site-selective sensitivity of transport current through a double quantum dot to charge noise, we extract potential fluctuations at individual dots without requiring additional sensing devices or spin operations. Based on the obtained power spectral densities, we discuss the coupling of a dominant two-level fluctuator to individual dots. We furthermore verify the consistency of the measurement protocol by applying artificial noise via gate electrodes and investigate the temperature dependence of charge noise correlations. The method offers a convenient and versatile alternative approach that substantially facilitates the assessment of charge noise correlations in diverse semiconductor qubit devices.
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Abstract Universal quantum computation requires high-fidelity single-qubit rotations and controlled two-qubit gates. Along with high-fidelity single-qubit gates, strong efforts have been made in developing robust two-qubit logic gates in electrically gated quantum dot systems to realise a compact and nanofabrication-compatible architecture. Here we perform measurements of state-conditional coherent oscillations of a charge qubit. Using a quadruple quantum dot formed in a Si/SiGe heterostructure, we show the first demonstration of coherent two-axis control of a double quantum dot charge qubit in undoped Si/SiGe, performing Larmor and Ramsey oscillation measurements. We extract the strength of the capacitive coupling between a pair of double quantum dots by measuring the detuning energy shift (≈75 μeV) of one double dot depending on the excess charge configuration of the other double dot. We further demonstrate that the strong capacitive coupling allows fast, state-conditional Landau–Zener–Stückelberg oscillations with a conditional π phase flip time of about 80 ps, showing a promising pathway towards multi-qubit entanglement and control in semiconductor quantum dots.
Bilayer graphene (BLG) quantum dots (QDs) are a promising platform for semiconductor qubits. However, the low-frequency charge noise that may ultimately limit coherence has remained largely unexplored. Here, we systematically characterize charge noise in gate-defined BLG QDs using transport-based noise spectroscopy. We extract a median amplitude of $ S_μ^{1/2} (1~\text{Hz}) = 1.16~μ\text{eV}/\sqrt{\text{Hz}}$, placing BLG well within the range reported for established semiconductor quantum-dot platforms. Across variations in charge occupation, confinement, source-drain bias, and charge-sensor operating conditions, neither the noise amplitude nor the spectral dependence shows a reproducible trend in electrostatic tuning, indicating that we extracted the intrinsic semiconductor noise. Consistent noise levels are further observed in double QDs and confirmed using an independent superconducting resonator-based dispersive readout. Extending the study to BLG devices incorporating transition metal dichalcogenide layers reveals no measurable charge noise increase in weakly proximitized QDs. These results validate BLG as a viable platform for coherent quantum information processing.
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