We have observed Hong-Ou-Mandel interference of high-brightness synchrotron x-rays with a Mach-Zehnder interferometer, yielding two-photon states of potential interest for x-ray quantum optics.
A promising approach for direct detection of quantum entanglement in solid state materials is probing with entangled particles. X-rays are ideal for characterization of many materials but have not been generated as entangled pairs in useful numbers, even at the most powerful synchrotron sources. This proposal describes how x-rays in fully entangled N00N states (with N = 2) can be produced by applying Hong-Ou-Mandel interferometry at an x-ray synchrotron source. The technical requirements for indistinguishable photons, x-ray beamsplitters, and interferometer design are met with existing resources. The entangled x-ray biphotons can be filtered from the unavoidable single photon background by simple diffraction from an analyzer crystal, resulting in intense beams suitable for characterizing quantum materials.
We analyze the interference of individual photons in two overlapping Mach–Zehnder interferometers joined via a common beam splitter. We show how two kinds of interference effects—single-photon Mach–Zehnder interference and two-photon Hong–Ou–Mandel interference—interfere with one another, partially canceling each other out. This configuration illustrates how quantum effects can combine nontrivially and, moreover, emphasizes that quantum interference happens at measurement. This work can serve as a bridge to more advanced quantum mechanical concepts, such as testing the predictions of quantum mechanics vs local realism.