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arXiv:2506.07103

Experimental Efficient Influence Sampling of Quantum Processes

Hao Zhan, Zongbo Bao, Zekun Ye, Qianyi Wang, Minghao Mi, Penghui Yao, Lijian Zhang

Published Jun 8, 2025• 0 citations
arXivHTMLPDF

Abstract

Characterizing quantum processes is essential for unlocking the potential of quantum devices. However, standard quantum process tomography is resource-intensive and becomes infeasible on large-scale systems. Despite alternative approaches have been successfully developed for specific scenarios, they typically rely on multi-qubit gates or extensive prior knowledge, limiting their practicability and scalability. To address these challenges and complement existing approaches, we introduce $\textit{influence sampling}$, an efficient and scalable protocol that quantifies the $\textit{influence}$ of a quantum process on all qubit subsets using only single-qubit test gates, with sample complexity independent of system size. Using a photonic platform, we demonstrate influence sampling to identify high-influence qubits, reduce the full process to a smaller effective process, i.e., a junta approximation, and then learn it. We further confirm scalability by applying the protocol to a 24-qubit system and validate the junta approximation on a two-qubit process. These results establish influence sampling as a critical characterization technique, facilitating process learning and device assessment.

DOI
10.48550/arxiv.2506.07103

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Characterizing quantum processes is essential for unlocking the potential of quantum devices. However, standard quantum process tomography is resource-intensive and becomes infeasible on large-scale systems. Despite alternative approaches have been successfully developed for specific scenarios, they typically rely on multi-qubit gates or extensive prior knowledge, limiting their practicability and scalability. To address these challenges and complement existing approaches, we introduce influence sampling\textit{influence sampling}influence sampling, an efficient and scalable protocol that quantifies the influence\textit{influence}influence of a quantum process on all qubit subsets using only single-qubit test gates, with sample complexity independent of system size. Using a photonic platform, we demonstrate influence sampling to identify high-influence qubits, reduce the full process to a smaller effective process, i.e., a junta approximation, and then learn it. We further confirm scalability by applying the protocol to a 24-qubit system and validate the junta approximation on a two-qubit process. These results establish influence sampling as a critical characterization technique, facilitating process learning and device assessment.
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As quantum devices make steady progress towards intermediate scale and fault-tolerant quantum computing, it is essential to develop rigorous and efficient measurement protocols that account for known sources of noise. Most existing quantum characterization protocols such as gate-set tomography and randomized benchmarking assume the noise acting on the qubits is Markovian. However, this assumption is often not valid, as for the case of 1/f charge noise or hyperfine nuclear spin noise. Here, we present a general framework for quantum process tomography (QPT) in the presence of time-correlated noise. We further introduce fidelity benchmarks that quantify the relative strength of different sources of Markovian and non-Markovian noise. As an application of our method, we perform a comparative theoretical and experimental analysis of silicon spin qubits. We first develop a detailed noise model that accounts for the dominant sources of noise and validate the model against experimental data. Applying our framework for time-correlated QPT, we find that the number of independent parameters needed to characterize one- and two-qubit gates can be compressed by 10× and 100× , respectively, when compared to the fully generic case. These compressions reduce the amount of tomographic measurements needed in experiment, while also significantly speeding up numerical simulations of noisy quantum circuit dynamics compared to time-dependent Hamiltonian simulation. Using this compressed noise model, we find good agreement between our theoretically predicted process fidelities and two-qubit interleaved randomized benchmarking fidelities of 99.8% measured in recent experiments on silicon spin qubits. More broadly, our formalism can be directly extended to develop efficient and scalable tuning protocols for high-fidelity control of large arrays of quantum devices with non-Markovian noise. Published by the American Physical Society 2024
Determining the Hamiltonian of a quantum system is essential for understanding its dynamics and validating its behavior. Hamiltonian learning provides a data-driven approach to reconstruct the generator of the dynamics from measurements on the evolved system. Among its applications, it is particularly important for benchmarking and characterizing quantum hardware, such as quantum computers and simulators. However, as these devices grow in size and complexity, this task becomes increasingly challenging. To address this, we propose a scalable and experimentally friendly Hamiltonian learning protocol for Hamiltonian operators made of local interactions. It leverages the quantum Zeno effect as a reshaping tool to localize the system's dynamics and then applies quantum process tomography to learn the coefficients of a local subset of the Hamiltonian acting on selected qubits. Unlike existing approaches, our method does not require complex state preparations and uses experimentally accessible, coherence-preserving operations. We derive theoretical performance guarantees and demonstrate the feasibility of our protocol both with numerical simulations and through an experimental implementation on IBM's superconducting quantum hardware, successfully learning the coefficients of a 109-qubit Hamiltonian.
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