arXiv:2402.15471 · Physical review. B./Physical review. B
Modeling phonon-mediated quasiparticle poisoning in superconducting qubit arrays
E. Yelton, C. P. Larson, Vito Iaia, Kenneth Dodge, Guglielmo La Magna, Paul Baity, Ivan Pechenezhskiy, R. McDermott, Noah Kurinsky, Gianluigi Catelani, B. L. T. Plourde
Background radiation can deposit large amounts of energy in the substrate of superconducting qubit arrays. Such events create bursts of energetic phonons that cause transient degradations of coherence, leading to errors. Correlated errors across multiple qubits are problematic for quantum error correction. The authors develop here a numerical model to describe the results of controlled phonon injection experiments. A dense array of qubits is modeled to explore the effectiveness of down-converting metal films for mitigating the effects of gamma ray impacts.
Background radiation can deposit large amounts of energy in the substrate of superconducting qubit arrays. Such events create bursts of energetic phonons that cause transient degradations of coherence, leading to errors. Correlated errors across multiple qubits are problematic for quantum error correction. The authors develop here a numerical model to describe the results of controlled phonon injection experiments. A dense array of qubits is modeled to explore the effectiveness of down-converting metal films for mitigating the effects of gamma ray impacts.
When a high-energy particle, such as a γ ray or muon, impacts the substrate of a superconducting qubit chip, large numbers of electron-hole pairs and phonons are created. The ensuing dynamics of the electrons and holes changes the local offset-charge environment for qubits near the impact site. The phonons that are produced have energy above the superconducting gap in the films that compose the qubits, leading to quasiparticle excitations above the superconducting ground state when the phonons impinge on the qubit electrodes. An elevated density of quasiparticles degrades qubit coherence, leading to errors in qubit arrays. Because these pair-breaking phonons spread throughout much of the chip, the errors can be correlated across a large portion of the array, posing a significant challenge for quantum error correction. In order to study the dynamics of γ -ray impacts on superconducting qubit arrays, we use a γ -ray source outside the dilution refrigerator to controllably irradiate our devices. By using charge-sensitive transmon qubits, we can measure both the offset-charge shifts and quasiparticle poisoning due to the γ irradiation at different doses. We study correlations between offset-charge shifts and quasiparticle poisoning for different qubits in the array and compare these with numerical modeling of charge and phonon dynamics following a γ -ray impact. We thus characterize the poisoning footprint of these impacts and quantify the performance of structures for mitigating phonon-mediated quasiparticle poisoning.
Quantum error correction can preserve quantum information in the presence of local errors, but correlated errors are fatal. For superconducting qubits, high-energy particle impacts from background radioactivity produce energetic phonons that travel throughout the substrate and create excitations above the superconducting ground state, known as quasiparticles, which can poison all qubits on the chip. We use normal metal reservoirs on the chip back side to downconvert phonons to low energies where they can no longer poison qubits. We introduce a pump-probe scheme involving controlled injection of pair-breaking phonons into the qubit chips. We examine quasiparticle poisoning on chips with and without back-side metallization and demonstrate a reduction in the flux of pair-breaking phonons by over a factor of 20. We use a Ramsey interferometer scheme to simultaneously monitor quasiparticle parity on three qubits for each chip and observe a two-order of magnitude reduction in correlated poisoning due to background radiation.
Quantum error correction (QEC) provides a practical path to fault-tolerant quantum computing through scaling to large qubit numbers, assuming that physical errors are sufficiently uncorrelated in time and space. In superconducting qubit arrays, high-energy impact events can produce correlated errors, violating this key assumption. Following such an event, phonons with energy above the superconducting gap propagate throughout the device substrate, which in turn generate a temporary surge in quasiparticle (QP) density throughout the array. When these QPs tunnel across the qubits' Josephson junctions, they induce correlated errors. Engineering different superconducting gaps across the qubit's Josephson junctions provides a method to resist this form of QP tunneling. By fabricating all-aluminum transmon qubits with both strong and weak gap engineering on the same substrate, we observe starkly different responses during high-energy impact events. Strongly gap engineered qubits do not show any degradation in T_{1} during impact events, while weakly gap engineered qubits show events of correlated degradation in T_{1}. We also show that strongly gap engineered qubits are robust to QP poisoning from increasing optical illumination intensity, whereas weakly gap engineered qubits display rapid degradation in coherence. Based on these results, gap engineering mitigates the threat of high-energy impacts to QEC in superconducting qubit arrays.
Quasiparticle poisoning following particle impacts poses a significant challenge to the development of fault-tolerant superconducting quantum computers, as a sudden excess of quasiparticles can simultaneously degrade the coherence of multiple qubits across large device arrays. In this work, we present a statistical analysis that models the time evolution of radiation-induced qubit energy relaxation through quasiparticle density dynamics. This study provides insight into quasiparticle loss processes by distinguishing between recombination and trapping decay channels and assessing their respective impact on qubit performance. We precisely measure quasiparticle recombination in multiple transmon qubits and uncover an unexpected dependence of qubit relaxation dynamics on deposited energy. By linking correlated relaxation events across qubits to ballistic phonon propagation, we introduce a statistical localization approach to extract the energy deposited in the substrate, which is in good agreement with Monte Carlo simulation. This work establishes the quantitative framework for using an arbitrary subset of superconducting transmon qubits in a QPU as energy-resolving witness particle detectors.
Errors that are correlated across a qubit array pose an obstacle to quantum error correction. We observe elevated correlated poisoning rates in superconducting qubit arrays at the start of a cooldown followed by power-law reductions in time, while the rate of offset charge shifts remains constant, evidence of nonionizing sources of pair-breaking phonon bursts. We also investigate different sample packages, with some exhibiting elevated poisoning due to mechanical impacts from the cryocooler. Possible sources include relaxation of built-up stress in device thin films, substrates, or packaging.
Quantum error correction will be an essential ingredient in realizing fault-tolerant quantum computing. However, most correction schemes rely on the assumption that errors are sufficiently uncorrelated in space and time. In superconducting qubits, this assumption is drastically violated in the presence of ionizing radiation, which creates bursts of high-energy phonons in the substrate. These phonons can break Cooper pairs in the superconductor and, thus, create quasiparticles over large areas, consequently reducing qubit coherence across the quantum device in a correlated fashion. A potential mitigation technique is to place large volumes of normal or superconducting metal on the device, capable of reducing the phonon energy to below the superconducting gap of the qubits. To investigate the effectiveness of this method, we fabricate a quantum device with four nominally identical nanowire-based transmon qubits. On the device, half of the niobium-titanium-nitride ground plane is replaced with aluminum (Al), which has a significantly lower superconducting gap. We deterministically inject high-energy phonons into the substrate by voltage biasing a galvanically isolated Josephson junction. In the presence of the small-gap material, we find a factor of 2--5 less degradation in the injection-dependent qubit lifetimes and observe that the undesired excited qubit state population is mitigated by a similar factor. We furthermore turn the Al normal with a magnetic field, finding no change in the phonon protection. This suggests that the efficacy of the protection in our device is not limited by the size of the superconducting gap in the Al ground plane. Our results provide a promising foundation for protecting superconducting-qubit processors against correlated errors from ionizing radiation.