arXiv:2307.03169
Demonstrating a superconducting dual-rail cavity qubit with erasure-detected logical measurements
Chou, Kevin S., Tali Shemma, Heather McCarrick, Tzu-Chiao Chien, James D. Teoh, Patrick Winkel, Amos Anderson, Chen, Jonathan, Jacob C. Curtis, Stijn J. de Graaf, John W. O. Garmon, Benjamin Gudlewski, William D. Kalfus, Trevor Keen, Nishaad Khedkar, Chan U Lei, Gangqiang Liu, Pinlei Lu, Yao Lu, Aniket Maiti, Luke Mastalli-Kelly, Mehta, Nitish, Shantanu Mundhada, A. Narla, Taewan Noh, Takahiro Tsunoda, Sophia H. Xue, Joseph O’Connell Yuan, Luigi Frunzio, José Aumentado, Shruti Puri, S. M. Girvin, Jr. Moseley, Robert J. Schoelkopf
Abstract
A critical challenge in developing scalable error-corrected quantum systems is the accumulation of errors while performing operations and measurements. One promising approach is to design a system where errors can be detected and converted into erasures. Such a system utilizing erasure qubits are known to have relaxed requirements for quantum error correction. A recent proposal aims to do this using a dual-rail encoding with superconducting cavities. However, experimental characterization and demonstration of a dual-rail cavity qubit has not yet been realized. In this work, we implement such a dual-rail cavity qubit; we demonstrate a projective logical measurement with integrated erasure detection and use it to measure dual-rail qubit idling errors. We measure logical state preparation and measurement errors at the $0.01\%$-level and detect over $99\%$ of cavity decay events as erasures. We use the precision of this new measurement protocol to distinguish different types of errors in this system, finding that while decay errors occur with probability $\sim 0.2\%$ per microsecond, phase errors occur 6 times less frequently and bit flips occur at least 140 times less frequently. These findings represent the first confirmation of the expected error hierarchy necessary to concatenate dual-rail erasure qubits into a highly efficient erasure code.