arXiv:2302.12280 · IEEE Transactions on Applied Superconductivity
Characterization of Asymmetric Gap-Engineered Josephson Junctions and 3D Transmon Qubits
Zach Steffen, S. K. Dutta, H. Wang, Kungang Li, Yizhou Huang, Yi-Hsiang Huang, Advait Mathur, F. C. Wellstood, B. S. Palmer
Abstract
We have fabricated and characterized asymmetric gap-engineered junctions and transmon devices. To create Josephson junctions with asymmetric gaps, Ti was used to proximitize and lower the superconducting gap of the Al counter-electrode. DC IV measurements of these small, proximitized Josephson junctions show a reduced gap and larger excess current for voltage biases below the superconducting gap when compared to standard Al/AlO$\mathrm{_{x}}$/Al junctions. The energy relaxation time constant for an Al/AlO$\mathrm{_{x}}$/Al/Ti 3D transmon was$T_{1}= 1\ \mu$s, over two orders of magnitude shorter than the measured$T_{1} = 134\ \mu$s of a standard Al/AlO$\mathrm{_{x}}$/Al 3D transmon. Intentionally adding disorder between the Al and Ti layers reduces the proximity effect and subgap current while increasing the relaxation time to$T_{1} = 32\ \mu$s.