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arXiv:2201.10425 · IEEE Transactions on Quantum Engineering

Qubit-Compatible Substrates With Superconducting Through-Silicon Vias

Kestutis Grigoras, Nikolai Yurttagül, J.-P. Kaikkonen, E. T. Mannila, Patrik Eskelinen, Daniel Pérez Lozano, Hang-Xi Li, M. Rommel, Daryoush Shiri, Nils Tiencken, Slawomir Simbierowicz, Alberto Ronzani, Joel Hätinen, Debopam Datta, Visa Vesterinen, Leif Grönberg, Janka Biznárová, Anita Fadavi Roudsari, Sandoko Kosen, Amr Osman, Mika Prunnila, Juha Hassel, Jonas Bylander, Joonas Govenius

Published Jan 1, 2022• 24 citations
arXivHTMLPDF

Abstract

We fabricate and characterize superconducting through-silicon vias and electrodes suitable for superconducting quantum processors. We measure internal quality factors of a million for test resonators excited at single-photon levels, on chips with superconducting vias used to stitch ground planes on the front and back sides of the chips. This resonator performance is on par with the state of the art for silicon-based planar solutions, despite the presence of vias. Via stitching of ground planes is an important enabling technology for increasing the physical size of quantum processor chips, and is a first step toward more complex quantum devices with three-dimensional integration.

DOI
10.1109/tqe.2022.3209881

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We fabricate and characterize superconducting through-silicon vias and electrodes suitable for superconducting quantum processors. We measure internal quality factors of a million for test resonators excited at single-photon levels, on chips with superconducting vias used to stitch ground planes on the front and back sides of the chips. This resonator performance is on par with the state of the art for silicon-based planar solutions, despite the presence of vias. Via stitching of ground planes is an important enabling technology for increasing the physical size of quantum processor chips, and is a first step toward more complex quantum devices with three-dimensional integration.
The large physical size of superconducting qubits and their associated on-chip control structures presents a practical challenge toward building a large-scale quantum computer. In particular, transmons require a high-quality-factor shunting capacitance that is typically achieved by using a large coplanar capacitor. Other components, such as superconducting microwave resonators used for qubit state readout, are typically constructed from coplanar waveguides, which are millimeters in length. Here, we use compact superconducting through-silicon vias to realize lumped-element capacitors in both qubits and readout resonators to significantly reduce the on-chip footprint of both of these circuit elements. We measure two types of devices to show that through-silicon vias are of sufficient quality to be used as capacitive circuit elements and provide a significant reduction in size over existing approaches.
As designs for superconducting qubits become more complex, 3D integration of two or more vertically bonded chips will become necessary to enable increased density and connectivity. Precise control of the spacing between these chips is required for accurate prediction of circuit performance. In this paper, we demonstrate an improvement in the planarity of bonded superconducting qubit chips while retaining device performance by utilizing hard-stop silicon spacer posts. These silicon spacers are defined by etching several microns into a silicon substrate and are compatible with 3D-integrated qubit fabrication. This includes fabrication of Josephson junctions, superconducting air-bridge crossovers, underbump metallization and indium bumps. To qualify the integrated process, we demonstrate high-quality factor resonators on the etched surface and measure qubit coherence (T1, T2,echo> 40 μs) in the presence of silicon posts as near as 350 μm to the qubit.
© 2019 IEEE. As designs for superconducting qubits become more complex, 3D integration of two or more vertically bonded chips will become necessary to enable increased density and connectivity. Precise control of the spacing between these chips is required for accurate prediction of circuit performance. In this paper, we demonstrate an improvement in the planarity of bonded superconducting qubit chips while retaining device performance by utilizing hard-stop silicon spacer posts. These silicon spacers are defined by etching several microns into a silicon substrate and are compatible with 3D-integrated qubit fabrication. This includes fabrication of Josephson junctions, superconducting air-bridge crossovers, underbump metallization and indium bumps. To qualify the integrated process, we demonstrate high-quality factor resonators on the etched surface and measure qubit coherence (T1, T2,echo > 40 μs) in the presence of silicon posts as near as 350 μm to the qubit.
The development of superconducting quantum computing has seen a rapid acceleration in recent years. The number of controllable qubits fabricated on-chip has steadily increased in the pursuit of more computational power. 3D integration has become a key enabling technology for the scalability of these larger systems due to the architectural flexibility it offers, mirroring its impact on conventional electronics. As part of this development, superconducting throughsilicon vias (TSVs) have recently emerged as a method of breaking the wiring plane and routing signals through the substrate as well as for other, more novel, applications such as acting as the capacitive component of a new type of superconducting qubit. This thesis will discuss the simulation, fabrication and measurement of superconducting TSVs. Using ANSYS HFSS electromagnetic simulation software, the geometric parameters of TSV-integrated co-planar waveguides were optimised for the transmission of microwave signals. In addition, a TSV-integrated tunable qubit coupler was simulated and the effect of the device’s geometry on the various capacitances within the device, and in turn on the device’s parameters, such as the charging and Josephson energies, was investigated. As a leading cause of signal degradation in electronic devices, crosstalk should be removed from devices as far as possible. Varying the number and arrangement of grounding TSVs was explored as a strategy for the mitigation of crosstalk between adjacent TSVs and it was found that using 4 ground TSVs to shield the signal TSV resulted in a dramatic reduction in crosstalk, with values of S41 <−140dB at 4GHz. For the fabricated samples, a comparison was made of different Bosch etches used to define the TSVs and it was determined that the ICP power and total etch time were highly influential in the degree of sidewall roughness. Methods of sidewall smoothing were also investigated, with KOH wet etching found to offer near atomic-level smoothness. Finally, the fabricated samples were characterised using, among other methods, cryogenic spectroscopy. A novel application of the method of calibrated cryogenic S-parameter measurement to superconducting TSVs is also presented, with the TSV-integrated co-planar waveguide structure under test exhibiting a peak transmission of -1.44dB.
Abstract To reach large-scale quantum computing, three-dimensional integration of scalable qubit arrays and their control electronics in multi-chip assemblies is promising. Within these assemblies, the use of superconducting interconnections, as routing layers, offers interesting perspectives in terms of (1) thermal management to protect the qubits from control electronics self-heating, (2) passive device performance with significant increase of quality factors and (3) density rise of low and high frequency signals thanks to minimal dispersion. We report on the fabrication, using 200 mm silicon wafer technologies, of a multi-layer routing platform designed for the hybridization of spin qubit and control electronics chips. A routing level couples the qubits and the control circuits through one layer of Al 0.995 Cu 0.005 and superconducting layers of TiN, Nb or NbN, connected between them by W-based vias. Wafer-level parametric tests at 300 K validate the yield of these technologies while low temperature electrical measurements in cryostat are used to extract the superconducting properties of the routing layers. Preliminary low temperature radio-frequency characterizations of superconducting passive elements, embedded in these routing levels, are presented.
Increasing circuit complexity within quantum systems based on superconducting qubits necessitates high connectivity while retaining qubit coherence. Classical micro-electronic systems have addressed interconnect density challenges by using 3D integration with interposers containing through-silicon vias (TSVs), but extending these integration techniques to superconducting quantum systems is challenging. Here, we discuss our approach for realizing high-aspect-ratio superconducting TSVs\textemdash 10 μμμm wide by 20 μμμm long by 200 μμμm deep\textemdash with densities of 100 electrically isolated TSVs per square millimeter. We characterize the DC and microwave performance of superconducting TSVs at cryogenic temperatures and demonstrate superconducting critical currents greater than 20 mA. These high-aspect-ratio, high critical current superconducting TSVs will enable high-density vertical signal routing within superconducting quantum processors.