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arXiv:2001.08653 · Physical Review A

Modeling noisy quantum circuits using experimental characterization

Megan Dahlhauser, Travis S. Humble

Published Apr 2, 2021• 35 citations
arXivHTMLPDF

Abstract

Noisy intermediate-scale quantum (NISQ) devices offer unique platforms to test and evaluate the behavior of quantum computing. However, validating circuits on NISQ devices is difficult due to fluctuations in the underlying noise sources and other nonreproducible behaviors that generate computational errors. Here we present a test-driven approach that decomposes a noisy, application-specific circuit into a series of bootstrapped experiments on a NISQ device. By characterizing individual subcircuits, we generate a composite noise model for the original quantum circuit. We demonstrate this approach to model applications of Greenberger-Horne-Zeilinger(GHZ)-state preparation and the Bernstein-Vazirani algorithm on a family of superconducting transmon devices. We measure the model accuracy using the total variation distance between predicted and experimental results, and we demonstrate that the composite model works well across multiple circuit instances. Our approach is shown to be computationally efficient and offers a trade-off in model complexity that can be tailored to the desired predictive accuracy.

DOI
10.1103/physreva.103.042603

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Noisy intermediate-scale quantum (NISQ) devices offer unique platforms to test and evaluate the behavior of quantum computing. However, validating circuits on NISQ devices is difficult due to fluctuations in the underlying noise sources and other nonreproducible behaviors that generate computational errors. Here we present a test-driven approach that decomposes a noisy, application-specific circuit into a series of bootstrapped experiments on a NISQ device. By characterizing individual subcircuits, we generate a composite noise model for the original quantum circuit. We demonstrate this approach to model applications of Greenberger-Horne-Zeilinger(GHZ)-state preparation and the Bernstein-Vazirani algorithm on a family of superconducting transmon devices. We measure the model accuracy using the total variation distance between predicted and experimental results, and we demonstrate that the composite model works well across multiple circuit instances. Our approach is shown to be computationally efficient and offers a trade-off in model complexity that can be tailored to the desired predictive accuracy.
The ability of a quantum computer to reproduce or replicate the results of a quantum circuit is a key concern for verifying and validating applications of quantum computing. Statistical variations in circuit outcomes that arise from ill-characterized fluctuations in device noise may lead to computational errors and irreproducible results. While device characterization offers a direct assessment of noise, an outstanding concern is how such metrics bound the reproducibility of a given quantum circuit. Here, we first directly assess the reproducibility of a noisy quantum circuit, in terms of the Hellinger distance between the computational results, and then we show that device characterization offers an analytic bound on the observed variability. We validate the method using an ensemble of single qubit test circuits, executed on a superconducting transmon processor with well-characterized readout and gate error rates. The resulting description for circuit reproducibility, in terms of a composite device parameter, is confirmed to define an upper bound on the observed Hellinger distance, across the variable test circuits. This predictive correlation between circuit outcomes and device characterization offers an efficient method for assessing the reproducibility of noisy quantum circuits.
Effective methods for characterizing the noise in quantum computing devices are essential for programming and debugging circuit performance. Existing approaches vary in the information obtained as well as the amount of quantum and classical resources required, with more information generally requiring more resources. Here we benchmark the characterization methods of gate set tomography, Pauli channel noise reconstruction, and empirical direct characterization for developing models that describe noisy quantum circuit performance on a 27-qubit superconducting transmon device. We evaluate these models by comparing the accuracy of noisy circuit simulations with the corresponding experimental observations. We find that the agreement of noise model to experiment does not correlate with the information gained by characterization and that the underlying circuit strongly influences the best choice of characterization approach. Empirical direct characterization scales best of the methods we tested and produced the most accurate characterizations across our benchmarks.
Maximizing the computational utility of near-term quantum processors requires predictive noise models that inform robust, noise-aware compilation and error mitigation. Conventional models often fail to capture the complex error dynamics of real hardware or require prohibitive characterization overhead. We introduce a data-efficient framework that first constructs a physically motivated, parameterized noise model, and subsequently employs machine-learning-driven Bayesian optimization to identify its parameters. Our approach circumvents costly characterization protocols by estimating algorithm- and hardware-specific error parameters directly from readily available experimental data derived from existing application and benchmark circuit executions. The generality and robustness of the framework are demonstrated across diverse algorithms and superconducting devices, yielding high-fidelity predictions by estimating an independent parameter set tailored to each specific algorithm-hardware context. Crucially, we show that a model calibrated exclusively on small-scale circuits accurately predicts the behavior of larger validation circuits. Our data-efficient approach achieves up to a 65% improvement in model fidelity quantified by the Hellinger distance between predicted and experimental circuit output distributions, compared to standard noise models derived from device properties. This work establishes a practical paradigm for application-aware noise characterization, enabling compilation and error-mitigation strategies tailored to the specific interplay between quantum algorithms and device-specific noise dynamics.
Noisy, intermediate-scale quantum (NISQ) computing devices offer opportunities to test the principles of quantum computing but are prone to errors arising from various sources of noise. Fluctuations in the noise itself lead to unstable devices that undermine the reproducibility of NISQ results. Here we characterize the reliability of NISQ devices by quantifying the stability of essential performance metrics. Using the Hellinger distance, we quantify the similarity between experimental characterizations of several NISQ devices by comparing gate fidelities, duty cycles, and register addressability across temporal and spatial scales. Our observations collected over 22 months reveal large fluctuations in each metric that underscore the limited scales on which current NISQ devices may be considered reliable.
In this article, we analyzed the performance of several classes of quantum circuits under various errors. We executed NISQ circuits on both noisy simulator and real hardware backend publicly available from IBM Quantum. On simulation, we created noise models with both individual errors and combination of multiple errors to quantify how each type of error impact performance of quantum circuits. We utilized statistical distances such as total variation distance (TVD), Jensen-Shannon divergence (JSD), and Hellinger distance, to measure the deviation of noisy output from ideal output. Finally, we compare the noisy outputs from the simulator and outputs from the real hardware to showcase the gap between simulation and real device experiment. This gap points to the limitation of present noise models failure to exhibit the behavior of real hardware.
In this article, we analyzed the performance of several classes of quantum circuits under various errors. We executed NISQ circuits on both noisy simulator and real hardware backend publicly available from IBM Quantum. On simulation, we created noise models with both individual errors and combination of multiple errors to quantify how each type of error impact performance of quantum circuits. We utilized statistical distances such as total variation distance (TVD), Jensen-Shannon divergence (JSD), and Hellinger distance, to measure the deviation of noisy output from ideal output. Finally, we compare the noisy outputs from the simulator and outputs from the real hardware to showcase the gap between simulation and real device experiment. This gap points to the limitation of present noise models failure to exhibit the behavior of real hardware.