arXiv:1802.05660 · International Journal of Quantum Information
Fidelity-based measurement-induced nonlocality over two-sided measurements
R. Muthuganesan, R. Sankaranarayanan
Abstract
In this paper, we introduce fidelity-based measurement-induced nonlocality for bipartite quantum state to capture the nonlocal effects due to two-sided von Neumann projective measurements. We identify that all the properties of this quantity are reflected from that of One-sided measurement. We compute this quantity for arbitrary pure and mixed bipartite states. As an illustration, we have studied the nonlocality of Bell diagonal state.