arXiv:1706.09626 · Physical Review Applied
Gate-Sensing Charge Pockets in the Semiconductor-Qubit Environment
Xanthe Croot, Sebastian Pauka, Marie Claire Jarratt, H. Lu, Arthur C. Gossard, J.D. Watson, G.C. Gardner, S. Fallahi, M.J. Manfra, D. J. Reilly
Abstract
Dispersive readout is a promising technique for enabling scalable measurements of gate-defined semiconductor qubits, but the repeated observation of anomalous signals when using this technique has not yet been explained. The authors study these anomalies and propose that they are caused by charge pockets that appear as gates are depleted, in close proximity to the intentionally formed quantum dots. Understanding these signals gives us a path toward eliminating them in the next generation of devices, and may help in identifying sources of charge noise, the origin of which is not fully understood for these systems.