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arXiv:1705.09158 · Nature Communications

Suppression of low-frequency charge noise in superconducting resonators by surface spin desorption

S. E. de Graaf, Lara Faoro, Jonathan Burnett, A. A. Adamyan, Alexander Ya. Tzalenchuk, Sergey Kubatkin, T. Lindström, A. V. Danilov

Published Mar 14, 2018• 93 citations
arXivHTMLPDF

Abstract

Noise and decoherence due to spurious two-level systems located at material interfaces are long-standing issues for solid-state quantum devices. Efforts to mitigate the effects of two-level systems have been hampered by a lack of knowledge about their chemical and physical nature. Here, by combining dielectric loss, frequency noise and on-chip electron spin resonance measurements in superconducting resonators, we demonstrate that desorption of surface spins is accompanied by an almost tenfold reduction in the charge-induced frequency noise in the resonators. These measurements provide experimental evidence that simultaneously reveals the chemical signatures of adsorbed magnetic moments and highlights their role in generating charge noise in solid-state quantum devices.

DOI
10.1038/s41467-018-03577-2

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Noise and decoherence due to spurious two-level systems located at material interfaces are long-standing issues for solid-state quantum devices. Efforts to mitigate the effects of two-level systems have been hampered by a lack of knowledge about their chemical and physical nature. Here, by combining dielectric loss, frequency noise and on-chip electron spin resonance measurements in superconducting resonators, we demonstrate that desorption of surface spins is accompanied by an almost tenfold reduction in the charge-induced frequency noise in the resonators. These measurements provide experimental evidence that simultaneously reveals the chemical signatures of adsorbed magnetic moments and highlights their role in generating charge noise in solid-state quantum devices.
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Recent experiments have indicated surface spins in superconducting devices to be associated with both flux- and charge noise. In particular, for superconducting resonators, where the frequency noise is dominated by the electric field from the resonator coupling to spurious two-level material defects, information on noise in applied magnetic fields is lacking. Here, we present measurements of frequency noise in a superconducting resonator with a centre frequency f0=6.1 GHz in fields exceeding the Zeeman splitting of surface spins (up to 310 mT), showing that the charge-induced noise is unaffected by the applied magnetic field.
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Superconducting quantum computing is experiencing a tremendous growth. Although major milestones have already been achieved, useful quantum-computing applications are hindered by a variety of decoherence phenomena. Decoherence due to two-level systems (TLSs) hosted by amorphous dielectric materials is ubiquitous in planar superconducting devices. We use high-quality quasilumped-element resonators as quantum sensors to investigate TLS-induced loss and noise. We perform two-tone experiments with a probe and pump electric fields; the pump is applied at different power levels and detunings. We measure and analyze time series of the quality factor and resonance frequency for very long time periods, up to 1000 h. We additionally carry out simulations based on the TLS interacting model in the presence of a pump field. We find that loss and noise are reduced at medium and high power, matching the simulations, but not at low power.
A critical limitation of solid-state quantum devices arises from the materials from which they are fabricated: uncontrolled surfaces, interfaces, and structural imperfections introduce numerous sources of loss and decoherence. Despite extensive efforts, linking these decoherence mechanisms to their microscopic material origins -- essential for developing effective mitigation strategies -- remains an outstanding challenge that has slowed coherence improvements. Here, using scanning gate microscopy on live superconducting circuits we identify a previously unrecognised decoherence mechanism originating from Coulomb blockade and microwave-driven charge tunnelling in metallic grains. Such grains are ubiquitous in thin-film devices fabricated by standard lithography processes. By characterising multiple defects across different devices, we find such defects to be as common and as debilitating to device performance as two-level system (TLS) defects, while originating from a fundamentally different physical mechanism. Importantly, conventional characterisation techniques would misattribute this loss to other, microwave power-independent processes. Our observations thus reveal a widespread source of decoherence in superconducting circuits, challenging the prevailing paradigm that coherence lifetimes are primarily limited by TLS defects. Eliminating metallic grains during fabrication provides a clear and practical route to suppress this mechanism, offering a pathway towards improved coherence and reduced noise in microwave-based solid-state quantum devices.
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