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arXiv:1612.07977 · EPJ Quantum Technology

Characterizing the attenuation of coaxial and rectangular microwave-frequency waveguides at cryogenic temperatures

Philipp Kurpiers, Theodore Walter, Paul Magnard, Yves Salathé, Andreas J. Wallraff

Published May 4, 2017• 44 citations
arXivHTMLPDF

Abstract

Low-loss waveguides are required for quantum communication at distances beyond the chip-scale for any low-temperature solid-state implementation of quantum information processors. We measure and analyze the attenuation constant of commercially available microwave-frequency waveguides down to millikelvin temperatures and single photon levels. More specifically, we characterize the frequency-dependent loss of a range of coaxial and rectangular microwave waveguides down to $0.005\ \mbox{dB}/\mbox{m}$ using a resonant-cavity technique. We study the loss tangent and relative permittivity of commonly used dielectric waveguide materials by measurements of the internal quality factors and their comparison with established loss models. The results of our characterization are relevant for accurately predicting the signal levels at the input of cryogenic devices, for reducing the loss in any detection chain, and for estimating the heat load induced by signal dissipation in cryogenic systems.

DOI
10.1140/epjqt/s40507-017-0059-7

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Low-loss waveguides are required for quantum communication at distances beyond the chip-scale for any low-temperature solid-state implementation of quantum information processors. We measure and analyze the attenuation constant of commercially available microwave-frequency waveguides down to millikelvin temperatures and single photon levels. More specifically, we characterize the frequency-dependent loss of a range of coaxial and rectangular microwave waveguides down to 0.005 \mboxdB/\mboxm0.005\ \mbox{dB}/\mbox{m}0.005 \mboxdB/\mboxm using a resonant-cavity technique. We study the loss tangent and relative permittivity of commonly used dielectric waveguide materials by measurements of the internal quality factors and their comparison with established loss models. The results of our characterization are relevant for accurately predicting the signal levels at the input of cryogenic devices, for reducing the loss in any detection chain, and for estimating the heat load induced by signal dissipation in cryogenic systems.
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Accurate in situ calibration of microwave attenuation and amplification-chain noise is essential for superconducting quantum circuits. We demonstrate a compact, self-calibrating cryogenic noise source based on an on-chip chromium attenuator that can be resistively heated with nanowatt-level power and directly integrated into a coaxial microwave line at the mixing-chamber stage. By comparing Johnson-Nyquist noise generated by Joule and microwave heating, measured through the amplification chain, the attenuation of the input line, and hence the gain of the chain, is determined without requiring knowledge of the attenuator temperature. The device exhibits millisecond-scale response times and negligible heating of the cryostat base plate. Using this approach, we determine the gain and added noise of a cryogenic amplification chain over the 4-8 GHz band. Our results provide a simple and accurate method to characterize near-quantum-limited parametric amplifiers used in superconducting-qubit readout.
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