arXiv:1412.5536 · Physical Review B
Microscopic models for charge-noise-induced dephasing of solid-state qubits
Félix Beaudoin, W. A. Coish
Abstract
Several experiments have shown qubit coherence decay of the form $exp[\ensuremath{-}{(t/{T}_{2})}^{\ensuremath{\alpha}}]$ due to environmental charge-noise fluctuations. We present a microscopic description for temperature dependencies of the parameters ${T}_{2}$ and $\ensuremath{\alpha}$. Our description is appropriate to qubits in semiconductors interacting with spurious two-level charge fluctuators coupled to a thermal bath. We find distinct power-law dependencies of ${T}_{2}$ and $\ensuremath{\alpha}$ on temperature depending on the nature of the interaction of the fluctuators with the associated bath. We consider fluctuator dynamics induced by first- and second-order tunneling with a continuum of delocalized electron states. We also study one- and two-phonon processes for fluctuators in either GaAs or Si. These results can be used to identify dominant charge-dephasing mechanisms and suppress them.