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arXiv:1308.2928 · Physical Review A

Investigating the limits of randomized benchmarking protocols

Jeffrey M. Epstein, Andrew W. Cross, Easwar Magesan, Jay Gambetta

Published Jun 18, 2014• 135 citations
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Abstract

In this paper, we analyze the performance of randomized benchmarking protocols on gate sets under a variety of realistic error models that include systematic rotations, amplitude damping, leakage to higher levels, and $1/f$ noise. We find that, in almost all cases, benchmarking provides better than a factor-of-2 estimate of average error rate, suggesting that randomized benchmarking protocols are a valuable tool for verification and validation of quantum operations. In addition, we derive models for fidelity decay curves under certain types of non-Markovian noise models such as $1/f$ and leakage errors. We also show that, provided the standard error of the fidelity measurements is small, only a small number of trials are required for high-confidence estimation of gate errors.

DOI
10.1103/physreva.89.062321

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In this paper, we analyze the performance of randomized benchmarking protocols on gate sets under a variety of realistic error models that include systematic rotations, amplitude damping, leakage to higher levels, and 1/f1/f1/f noise. We find that, in almost all cases, benchmarking provides better than a factor-of-2 estimate of average error rate, suggesting that randomized benchmarking protocols are a valuable tool for verification and validation of quantum operations. In addition, we derive models for fidelity decay curves under certain types of non-Markovian noise models such as 1/f1/f1/f and leakage errors. We also show that, provided the standard error of the fidelity measurements is small, only a small number of trials are required for high-confidence estimation of gate errors.
Randomized benchmarking allows one to efficiently and scalably characterize the average error of a unitary 2-design such as the Clifford group C\mathcal{C}C on a physical candidate for quantum computation, as long as there are no noncomputational leakage levels in the system. We investigate the effect of leakage errors on randomized benchmarking induced from an additional level per physical qubit and provide a modified protocol that allows us to derive reliable estimates for the error per gate in their presence. We assess the variance of the sequence fidelity corresponding to the number of random sequences needed for valid fidelity estimation. Our protocol allows for gate-dependent error channels without being restricted to perturbations. We show that our protocol is compatible with interleaved randomized benchmarking and expand to benchmarking of arbitrary gates. This setting is relevant for superconducting transmon qubits, among other systems.
Randomized benchmarking is a promising tool for characterizing the noise in experimental implementations of quantum systems. In this paper, we prove that the estimates produced by randomized benchmarking (both standard and interleaved) for arbitrary Markovian noise sources are remarkably precise by showing that the variance due to sampling random gate sequences is small. We discuss how to choose experimental parameters, in particular the number and lengths of random sequences, in order to characterize average gate errors with rigorous confidence bounds. We also show that randomized benchmarking can be used to reliably characterize time-dependent Markovian noise (e.g., when noise is due to a magnetic field with fluctuating strength). Moreover, we identify a necessary property for time-dependent noise that is violated by some sources of non-Markovian noise, which provides a test for non-Markovianity.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.
Randomized benchmarking (RB) is an efficient and robust method to characterize gate errors in quantum circuits. Averaging over random sequences of gates leads to estimates of gate errors in terms of the average fidelity. These estimates are isolated from the state preparation and measurement errors that plague other methods such as channel tomography and direct fidelity estimation. A decisive factor in the feasibility of randomized benchmarking is the number of sampled sequences required to obtain rigorous confidence intervals. Previous bounds were either prohibitively loose or required the number of sampled sequences to scale exponentially with the number of qubits in order to obtain a fixed confidence interval at a fixed error rate. Here, we show that, with a small adaptation to the randomized benchmarking procedure, the number of sampled sequences required for a fixed confidence interval is dramatically smaller than could previously be justified. In particular, we show that the number of sampled sequences required is essentially independent of the number of qubits and scales favorably with the average error rate of the system under investigation. We also investigate the fitting procedure inherent to randomized benchmarking in light of our results and find that standard methods such as ordinary least squares optimization can give misleading results. We therefore recommend moving to more sophisticated fitting methods such as iteratively reweighted least squares optimization. Our results bring rigorous randomized benchmarking on systems with many qubits into the realm of experimental feasibility.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB experiments provide direct estimates of the gateset circuit fidelity, a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gateset. We also prove that, in the limit of high-fidelity single-qubit experiments, the difficulty introduced by gate-dependence reduces to a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these result hold for higher dimensions.
Quantum computers have the potential to bring about a new age of technology, but in order for them to become a reality, the elephant in the room must be addressed, quantum errors. The complexity of quantum errors grows exponentially as the system size is increased; scalable characterization protocols which work under physically realistic noise are therefore needed to assess and optimize control. \n \nRandomized Benchmarking (RB) is a family of characterization protocols with the requisite qualities. RB protocols are independent of state preparation and measurement (SPAM) errors, and because they extract partial information about the error profiles in the form of figures of merit, they are scalable in the number of qubits. In this thesis, we study these figures of merit under various error models, gate-sets, and sample distributions, to further our understanding of their physical meaning, and to fine-tune the best practice for diagnosing errors in basic gate-sets. \n \nThe first study presented in this thesis looks at the physical meaning of the unitarity under physically realistic gate-dependent noise. Numerically, we demonstrate that under these realistic noise models, the unitarity obtained via Extended RB (XRB) overlaps strongly with the average of the unitarity of the errors over the set of individual operations. \n \nThe second study numerically and analytically proves that the Standard RB (SRB) decay parameter p coincides with the decay parameter of the novel figure of merit gate-set circuit fidelity. We also prove that, in the limit of high-fidelity single-qubit experiments, the disconnect between the average gate fidelity and SRB experimental results is caused by a basis mismatch between the gates and the state-preparation and measurement procedures. \n \nIn the third part of this thesis, we compare the results of two variations of the SRB protocol, one that samples uniformly (SRB) and one that samples non-uniformly (NIST RB) from the Clifford group. We prove that NIST RB produces an exponential fidelity curve that gives different infidelity results than SRB. \n \nThe fourth and final study gives a standard for assessing basic gate-sets. Experimental results are given from the assessment run on super-conducting and ion-trap devices. We also experimentally show how the systematic error bounds can be tightened by accounting for the error's degree of coherence, as well as using weaker randomizing sets.