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arXiv:1007.1540

Current Noise Investigation in Josephson Devices by Switching Current Measurements

C. Granata, Antonio Vettoliere, Roberto Russo, M. Russo, B. Ruggiero

Published Jul 9, 2010• 0 citations
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Abstract

An experimental investigation of the critical current noise in underdamped niobium based Josephson junctions by a technique based on the switching current measurements is reported. By sweeping the junction with a current ramp we measure the critical current switching using the standard time of flight technique and analyze the data to extract the current noise. The experimental results show a linear behavior of the current white noise from both the junction area and the temperature. These measurement provide very useful information about the intrinsic noise of Josephson devices involving SQUIDs and qubits.

DOI
10.48550/arxiv.1007.1540

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An experimental investigation of the critical current noise in underdamped niobium based Josephson junctions by a technique based on the switching current measurements is reported. By sweeping the junction with a current ramp we measure the critical current switching using the standard time of flight technique and analyze the data to extract the current noise. The experimental results show a linear behavior of the current white noise from both the junction area and the temperature. These measurement provide very useful information about the intrinsic noise of Josephson devices involving SQUIDs and qubits.
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Experimental measurements on critical current noise in underdamped niobium based Josephson devices by a technique based on the switching current measurements is reported. By sweeping the junction with a current ramp we measure the critical current switching as a function of the time using the standard time of flight technique. In such a way it is possible to obtain the critical current fluctuations ΔIc=Ic(t)-<Ic(t)> and the relative standard deviations which corresponds to the root square of the current fluctuation power. Pointing at the white noise fluctuations (above few Hz) and taking into account the physical frequency of the device, it is possible to evaluate the power spectral density of the critical current. The analysis has involved high quality underdamped Josephson junctions having an area ranging from (4x4) μm2 to (40x40) μm2 in the temperature range from 4.2 K to few tenth of mK. These measurement provide very useful information about the intrinsic noise of Josephson devices involving SQUIDs and qubits.
We present switching current measurements in niobium-aluminum oxide-niobium underdamped Josephson rings. Underdamped Josephson rings display hysteretic current-voltage curves which can be characterized by their switching current, the value of applied current at which the junctions switch to the energy-gap voltage. The value of the switching current is strongly affected by temperature and by the presence of fluxons in the system. We observe a very small voltage (0.2 nV) across the ring prior to switching, indicating a low-velocity fluxon diffusion state before the jump to a full running state. In analogy with previous work on single junctions, we analyze the switching current data with the process of thermal activation over a dissipation barrier, where the system switches from a low velocity state to a high velocity state. We find that our data agrees qualitatively with this description, further supporting the observation of fluxon diffusion.
We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2∕Af, where A is the area of both junctions, and C≈(3.9±0.4)×10−23m2∕K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l∕f noise should scale as 1∕T for temperatures down to at least 0.09K.
Superconducting quantum circuits (SQCs) are being explored as model systems for scalable quantum computing architectures. Josephson junctions are extensively used in superconducting quantum interference devices (SQUIDs) and in persistent-current qubit systems. Noise excitations, however, have a critical influence on their dynamics. Thus, the primary focus of this research was to investigate the effects of thermal ac-tivation on the superconducting properties of Josephson junctions. Specifically, ther-mal noise tends to result in a range of switching currents, values less than the critical current at which a junction switches from the superconducting to the normal state. First, a general review of superconductivity concepts is given, including a treatment of the Josephson phenomena. Next, I describe some of my work on characterizing the current-voltage traces of Josephson junctions tested at 4 K with a Multi-Chip Probe (MCP). Then, I describe thermal activation theory and examine the equations useful for modeling switching current distributions. The Josephson junctions of a SQUID with a ramped bias current were tested for numerous temperatures T < 4.5 K (and
Thermal noise induced switching of Josephson logic devices is studied, both theoretically and experimentally. The results are critical for the design of the operating bias points for these devices. An analysis of the relevant energy contours shows that a three-junction superconducting quantum interference device has the same noise switching rate as a point junction with the same maximum critical current. Experimental results, for the dependence of the thermal noise induced switching rate on the gate current bias ratio, are in very good agreement with the theory.