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arXiv:0902.2980 · Physical Review Letters

Charging Effects in the Inductively Shunted Josephson Junction

Jens Koch, Vladimir Manucharyan, Michel Devoret, L. I. Glazman

Published Nov 19, 2009• 119 citations
arXivHTMLPDF

Abstract

The choice of impedance used to shunt a Josephson junction determines if the charge transferred through the circuit is quantized: a capacitive shunt renders the charge discrete, whereas an inductive shunt gives continuous charge. This discrepancy leads to a paradox in the limit of large inductances L. We show that while the energy spectra of the capacitively and inductively shunted junction are vastly different, their high-frequency responses become identical for large L. Inductive shunting thus opens the possibility to observe charging effects unimpeded by charge noise.

DOI
10.1103/physrevlett.103.217004

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The choice of impedance used to shunt a Josephson junction determines if the charge transferred through the circuit is quantized: a capacitive shunt renders the charge discrete, whereas an inductive shunt gives continuous charge. This discrepancy leads to a paradox in the limit of large inductances L. We show that while the energy spectra of the capacitively and inductively shunted junction are vastly different, their high-frequency responses become identical for large L. Inductive shunting thus opens the possibility to observe charging effects unimpeded by charge noise.
We have measured the energy level separation from the ground state to the first excited state in a high critical tem- perature superconductor d-wave Josephson junction. We observe that the bias current dependence of the energy level separation is strongly affected by the large shunt capacitance and inductance of the junction electrodes. In order to describe the effect of a shunt capacitance and shunt inductance on the junction dynamics we de- rive the equation of motion of the total system. In general such a circuit displays two resonance frequencies corresponding to two different energy scales. We discuss various limits for the values of the shunt inductor and capacitor. Index Terms—High-temperature superconductors, Josephson junctions, resonance, superconducting devices.
We have studied both theoretically and experimentally how an LC series circuit connected in parallel to a Josephson junction influences the Josephson dynamics. The presence of the shell circuit introduces two energy scales, which in specific cases, can strongly differ from the plasma frequency of the isolated junction. Josephson junctions were manufactured using the Nb/Al-AlOx/Nb fabrication technology with various on-chip LC shunt circuits. Spectroscopic measurements in the quantum limit show excellent agreement with theory taking into account the shunt inductance and capacitance in the resistively and capacitively shunted junction model. The results clearly show that the dynamics of the system are two-dimensional, resulting in two resonant modes of the system. These findings have important implications for the design and operation of Josephson junction based quantum bits.
Abstract Josephson junctions supply the nonlinear inductance element in superconducting qubits. In the widely used transmon configuration, where the junction is shunted by a large capacitor, the low charging energy minimizes the sensitivity of the qubit to charge noise while maintaining the necessary anharmonicity to qubit states. We report here low-frequency transport measurements on small standalone junctions and identically fabricated capacitively-shunted junctions that show two distinct features normally attributed to small capacitance junctions near zero bias: reduced switching currents and prominent finite resistance associated with phase diffusion in the current–voltage characteristic. Our transport data reveals the existence of phase fluctuations in transmons arising from intrinsic junction capacitance.
The shunt resistors used in many Josephson junction circuits contain an inductive component that can significantly degrade high-frequency performance. Numerical simulations reveal complex dynamical behaviour, including relaxation oscillations, period-doubling sequences, and chaos, all of which are serious problems for applications as high-frequency sources and detectors. This complex AC behaviour creates features in the simulated DC current-voltage characteristics. Since these simulations closely match experimental data, they can be used to investigate the high-frequency AC behaviour of real junctions. Thus, we are able to use simple DC measurements to observe evidence of complex high-frequency dynamics. The inductance of the shunt branch can be accurately determined by comparing simulations to measurements. Simulations also allow us to map regions of the parameter space which exhibit complicated behaviour. These regions should be avoided when a nearly sinusoidal voltage waveform is desired, as is the case for Josephson junction-based oscillators.
We have measured Nb–AlOx–Nb Josephson tunnel junctions which have resistive shunts with different parasitic inductances. Numerical simulations reveal that specific features in the experimental current–voltage (I–V) characteristics of these devices are dc signatures of complex ac behavior. Depending on the inductance of the shunt loop and the capacitance of the junction, these features may either appear or disappear as the temperature of the device is increased. Examination of the simulated voltage waveforms allows us to map regions of the parameter space which exhibit complicated behavior. These regions should be avoided when a nearly sinusoidal voltage waveform is desired, as is the case for Josephson junction-based oscillators. The agreement of the experimental and simulated I–V curves also enables us to accurately determine the inductance of the shunts and the capacitance of the junctions.