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arXiv:cond-mat/0608390 · Physical Review B

Dynamic critical behaviors in two-dimensional Josephson junction arrays with positional disorder

Jaegon Um, Beom Jun Kim, Petter Minnhagen, M. Y. Choi, Sung‐Ik Lee

Published Sep 28, 2006• 10 citations
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Abstract

We numerically investigate dynamic critical behaviors of two-dimensional (2D) Josephson-junction arrays with positional disorder in the scheme of the resistively shunted junction dynamics. Large-scale computation of the current-voltage characteristics reveals evidence supporting that a phase transition occurs at a nonzero critical temperature in the strong disorder regime, as well as in the weak disorder regime. The phase transition at weak disorder appears to belong to the Berezinskii-Kosterlitz-Thouless (BKT) type. In contrast, evidence for a non-BKT transition is found in the strong disorder regime. These results are consistent with the recent experiment on positionally disordered Josephson-junction arrays; in particular, the critical temperature of the non-BKT transition (ranging from 0.265 down to the minimum 0.22 in units of ${E}_{J}∕{k}_{B}$ with the Josephson coupling strength ${E}_{J}$), the correlation length critical exponent $\ensuremath{\nu}=1.2$, and the dynamic critical exponent $z=2.0$ in the strong disorder regime agree with the existing studies of the 2D gauge-glass model.

DOI
10.1103/physrevb.74.094516

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We numerically investigate dynamic critical behaviors of two-dimensional (2D) Josephson-junction arrays with positional disorder in the scheme of the resistively shunted junction dynamics. Large-scale computation of the current-voltage characteristics reveals evidence supporting that a phase transition occurs at a nonzero critical temperature in the strong disorder regime, as well as in the weak disorder regime. The phase transition at weak disorder appears to belong to the Berezinskii-Kosterlitz-Thouless (BKT) type. In contrast, evidence for a non-BKT transition is found in the strong disorder regime. These results are consistent with the recent experiment on positionally disordered Josephson-junction arrays; in particular, the critical temperature of the non-BKT transition (ranging from 0.265 down to the minimum 0.22 in units of EJ∕kB{E}_{J}∕{k}_{B}EJ​∕kB​ with the Josephson coupling strength EJ{E}_{J}EJ​), the correlation length critical exponent \ensuremathν=1.2\ensuremath{\nu}=1.2\ensuremathν=1.2, and the dynamic critical exponent z=2.0z=2.0z=2.0 in the strong disorder regime agree with the existing studies of the 2D gauge-glass model.
Dynamical simulations and scaling arguments are used to study the current-voltage $(I\ensuremath{-}V)$ characteristics of a two-dimensional model of resistively shunted Josephson-junction arrays in presence of percolative disorder, at zero external field. Two different limits of the Josephson-coupling concentration ppp are considered, where pc{p}_{c}pc​ is the percolation threshold. For p>pcp>{p}_{c}p>pc​ and zero temperature, the $I\ensuremath{-}V$ curves show power-law behavior above a disorder-dependent critical current. The power-law behavior and critical exponents are consistent with a simple scaling analysis. At pc{p}_{c}pc​ and finite temperature T,T,T, the results show the scaling behavior of a T=0T=0T=0 superconducting transition. The resistance is linear but vanishes for decreasing TTT with an apparent exponential behavior. Crossover to nonlinearity appears at currents proportional to ${T}^{1+{\ensuremath{\nu}}_{T}},$ with a thermal-correlation length exponent ${\ensuremath{\nu}}_{T}$ consistent with the corresponding value for the diluted XY\mathrm{XY}XY model at pc.{p}_{c}.pc​.
Using resistivity-shunted-junction dynamics, we model bond dilutions in Josephson junction arrays. The current-voltage characteristics are obtained by large-scale numerical simulations. By dynamic scaling analysis to the finite-temperature phase transition, we provide clear evidence for the existence of non-Kosterlitz–Thouless-type phase transition, as described by Kosterlitz et al. [J. Phys. C 6, 1181 (1973); J. Phys. C 7, 1046 (1974)] in a wide range of disorder strengths. Critical temperature and exponents of the phase transitions are estimated, which are further confirmed by the finite-size scaling analysis at the transition temperature.
We numerically investigate the intriguing effects produced by random percolative disorder in two-dimensional Josephson junction arrays. By dynamic scaling analysis, we evaluate critical temperatures and critical exponents with high accuracy. It is observed that with the introduction of site-diluted disorder, the Kosterlitz-Thouless phase transition is eliminated and evolves into a continuous transition with power-law divergent correlation length. Moreover, genuine depinning transition and creep motion are studied; evidence for distinct creep motion types is provided. Our results not only are in good agreement with the recent experimental findings but also shed some light on the relevant phase transitions.
It has been suggested [Pierson et al., Phys. Rev. B 60, 1309 (1999); Ammirata et al., Physica C 313, 225 (1999)] that for two-dimensional (2D) superconductors there exists a phase transition with the dynamic critical exponent $z\ensuremath{\approx}5.6.$ We perform simulations for the 2D resistively-shunted-junction model and compare the results with the experimental data in Repaci et al. obtained for an ultrathin YBCO sample [Phys. Rev. B 54, R9674 (1996)]. We then use a different method of analyzing dynamic scaling than in Pierson et al., and conclude that both the simulations and the experiments are consistent with a conventional Kosterlitz Thouless (KT) transition in the thermodynamic limit for which z=2.z=2.z=2. For finite systems, however, we find both in simulations and experiments that the change in the current-voltage $(I\ensuremath{-}V)$ characteristics caused by the finite size shows a scaling property with an exponent $\ensuremath{\alpha}\ensuremath{\approx}1/6,$ seemingly suggesting a vanishing resistance at a temperature for which $z={\ensuremath{\alpha}}^{\ensuremath{-}1}.$ It is pointed out that the dynamic critical exponent found in Pierson et al. corresponds to the exponent ${\ensuremath{\alpha}}^{\ensuremath{-}1}.$ It is emphasized that this scaling property does not represent any true phase transition since in reality the resistance vanishes only at zero temperature. Nevertheless, the observed scaling behavior associated with $\ensuremath{\alpha}\ensuremath{\approx}1/6$ appears to be a common and intriguing feature for the finite size caused change in the $I\ensuremath{-}V$ characteristics around the KT transition.
We numerically investigate the intriguing effects produced by random percolative disorder in two-dimensional Josephson-junction arrays. By dynamic scaling analysis, we evaluate critical temperatures and critical exponents with high accuracy. It is observed that, with the introduction of site-diluted disorder, the Kosterlitz-Thouless phase transition is eliminated and evolves into a continuous transition with power-law divergent correlation length. Moreover, genuine depinning transition and creep motion are studied, evidence for distinct creep motion types is provided. Our results not only are in good agreement with the recent experimental findings, but also shed some light on the relevant phase transitions.
In recent years many groups have used Fisher, Fisher and Huse (FFH) dynamical scaling to investigate and demonstrate details of the superconducting phase transition. Some attention has been focused on two dimensions where the phase transition is of the Kosterlitz-Thouless-Berezinskii (KTB) type. Pierson et al. used FFH dynamical scaling almost exclusively to suggest that the dynamics of the two-dimensional superconducting phase transition may be other than KTB-like. In this work we investigate the ability of scaling behavior by itself to yield useful information on the nature of the transition. We simulate current-voltage (IV) curves for two-dimensional Josephson junction arrays with and without finite-size-induced resistive tails. We find that, for the finite-size effect data, the values of the scaling parameters, specifically the transition temperature and the dynamical scaling exponent z, depend critically on the magnitude of the contribution that the resistive tails make to the IV curves. In effect, the values of the scaling parameters depend on the noise floor of the measuring system.