Critical phenomena in the two-dimensional Ising model with a defect line are studied using boundary conformal field theory on the
c=1 orbifold. Novel features of the boundary states arising from the orbifold structure, including continuously varying boundary critical exponents, are elucidated. New features of the Ising defect problem are obtained including a novel universality class of defect lines and the universal boundary to bulk crossover of the spin correlation function.
The factorization proposal claims that the codimension one “pinning defect,” on which a local relevant operator is integrated, factorizes the space into two halves in general conformal field theories in the infrared limit. In this paper, we study a two-dimensional long-range Ising model at criticality with a line defect or an interface, which physically corresponds to changing the local temperature on it. We show that in the perturbative regime, it is not factorizing even in the infrared limit. An intuitive explanation of the nonfactorization is that the long-range Ising model is equivalent to a local conformal field theory in higher dimensions. In this picture, the space is still connected through the “extra dimension” across the defect line.
The critical two-dimensional classical Ising model on the square lattice has two topological conformal defects: the
Z2 symmetry defect ${D}_{\ensuremath{\epsilon}}$ and the Kramers-Wannier duality defect ${D}_{\ensuremath{\sigma}}$. These two defects implement antiperiodic boundary conditions and a more exotic form of twisted boundary conditions, respectively. On the torus, the partition function
ZD of the critical Ising model in the presence of a topological conformal defect
D is expressed in terms of the scaling dimensions ${\mathrm{\ensuremath{\Delta}}}_{\ensuremath{\alpha}}$ and conformal spins ${s}_{\ensuremath{\alpha}}$ of a distinct set of primary fields (and their descendants, or conformal towers) of the Ising conformal field theory. This characteristic conformal data ${{{\mathrm{\ensuremath{\Delta}}}_{\ensuremath{\alpha}},{s}_{\ensuremath{\alpha}}}}_{D}$ can be extracted from the eigenvalue spectrum of a transfer matrix
MD for the partition function
ZD. In this paper, we investigate the use of tensor network techniques to both represent and coarse grain the partition functions ${Z}_{{D}_{\ensuremath{\epsilon}}}$ and ${Z}_{{D}_{\ensuremath{\sigma}}}$ of the critical Ising model with either a symmetry defect ${D}_{\ensuremath{\epsilon}}$ or a duality defect ${D}_{\ensuremath{\sigma}}$. We also explain how to coarse grain the corresponding transfer matrices ${M}_{{D}_{\ensuremath{\epsilon}}}$ and ${M}_{{D}_{\ensuremath{\sigma}}}$, from which we can extract accurate numerical estimates of ${{{\mathrm{\ensuremath{\Delta}}}_{\ensuremath{\alpha}},{s}_{\ensuremath{\alpha}}}}_{{D}_{\ensuremath{\epsilon}}}$ and ${{{\mathrm{\ensuremath{\Delta}}}_{\ensuremath{\alpha}},{s}_{\ensuremath{\alpha}}}}_{{D}_{\ensuremath{\sigma}}}$. Two key ingredients of our approach are (i) coarse graining of the defect
D, which applies to any (i.e., not just topological) conformal defect and yields a set of associated scaling dimensions ${\mathrm{\ensuremath{\Delta}}}_{\ensuremath{\alpha}}$, and (ii) construction and coarse graining of a generalized translation operator using a local unitary transformation that moves the defect, which only exist for topological conformal defects and yields the corresponding conformal spins ${s}_{\ensuremath{\alpha}}$.