Optics Express
Machine-learning-enhanced Rydberg transient readout of weak electric pulses
Chunyang Jia, Wenhao Luo, Yue Chang, Jiaao Li, Xuehua Chen, Xiaobo Song, Hongjia Wang, Nan cong, Renfu Yang
Abstract
Rydberg-atom electrometry based on electromagnetically induced transparency (EIT) offers an optical approach for electric-field readout, but reliable readout of weak transient responses remains challenging under low signal-to-noise ratio (SNR) conditions. Here, we demonstrate machine-learning-enhanced readout of partial-discharge-like (PD-like) transient responses in a Cs 73 D 5/2 Rydberg-EIT vapor-cell system. Matched filtering (MF) and normalized cross-correlation (NCC) are used for candidate generation, followed by principal component analysis (PCA)/logistic-regression-based waveform-morphology discrimination and a cross-cycle temporal-consistency refinement. Across experimentally acquired low-SNR cycles, the PCA/logistic morphology selector achieved a strict localization accuracy of 63.25%, which increased to 86.32% after incorporating cross-cycle temporal consistency. The results indicate that weak Rydberg-EIT transient responses can retain discriminative local waveform morphology even when conventional template-peak ranking becomes unreliable. Overall, these results demonstrate that morphology-based machine-learning discrimination, complemented by temporal-consistency refinement, can improve the reliability of weak Rydberg-EIT transient readout under low-SNR conditions.