Hyperfine-structure-resolved absorption spectra of the $6\phantom{\rule{0.2em}{0ex}}^{2}S_{1∕2}\ensuremath{\rightarrow}5\phantom{\rule{0.2em}{0ex}}^{2}D_{5∕2}$ of cesium atoms have been observed with a temperature-controlled cell and a diode laser. From a comparison with the absorption of the
D2 transition at the same atom density range, the oscillator strength of the electric quadrupole transition was determined to be $(4.69\ifmmode\pm\else\textpm\fi{}0.05)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}7}$. Reflection spectra of the same transition have also been observed in the partial and total reflection regimes with a reflection cell. An increase in the apparent oscillator strength was observed for total reflection with an increase in the angle of incidence, by a factor up to 1.5 at ${\ensuremath{\theta}}_{c}+83.8\phantom{\rule{0.3em}{0ex}}\mathrm{mrad}$ and 2.4 at ${\ensuremath{\theta}}_{c}+107.5\phantom{\rule{0.3em}{0ex}}\mathrm{mrad}$ for
s and
p polarizations, respectively, where ${\ensuremath{\theta}}_{c}$ is the critical angle. The observed enhancement is ascribed to the incidence-angle-dependent wave vector and polarization vector of the evanescent wave.
The absorption line strengths of electric-dipole-forbidden (magnetic dipole and electric quadrupole) transitions have been calculated in the evanescent light field that accompanies the total reflection of light. Owing to the complex wave and polarization vectors of the evanescent light, the apparent oscillator strength is enhanced from that in the propagating light and the enhancement for the electric quadrupole transition depends on the polarization vector of the incident light. Separation of the contribution from each component of the wave and polarization vectors is proposed with a magnetic-sublevel-resolved measurement for the $(s\text{\ensuremath{-}}d)$ electric quadrupole transition.