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Microwave induced frequency shift and its quadrature compensation for Si/SiGe spin qubit

健太 武田, Kenta Takeda, Jun Yoneda, T. Otsuka, 拓夢 本田, Matthieu R. Delbecq, 哲夫 小寺, Tetsuo Kodera, J. Kamioka, 清悟 樽茶, T. Honda, Tetsuo Kodera, T. Kodera, S. Oda, Y. Hoshi, N. Usami, Kohei M. Itoh, Seigo Tarucha

Published Aug 1, 2017• 0 citations
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Silicon-based spin qubits in Si/SiGe heterostructures are a leading platform for scalable quantum computing, yet bridging the gap between theoretical computer-aided design(CAD) models and experimental reality remains a significant challenge. Standard simulations often fail to capture critical physical phenomena, such as interface dipoles, parasitic charge accumulation, and the magnetic hysteresis of on-chip micromagnets. In this work, we present a comprehensive, experimentally calibrated 3D simulation pipeline for a 6-dot Si/SiGe device. We refine the semiconductor band alignment and introduce a semi-empirical classical charge screening model to accurately capture the formation of parasitic wells and their suppression of gate lever-arms. Furthermore, we apply the Jiles-Atherton model to account for the hysteresis and pre-magnetization of integrated cobalt micromagnets, successfully reproducing the experimental resonant frequencies across all six qubits. By coupling these calibrated electrostatic and magnetic profiles into a time-dependent rotating wave approximation (RWA) Hamiltonian, we reproduce experimental observables, including microwave power chevrons. This framework provides a robust foundation for predicting device behavior, evaluating microwave line losses, and optimizing future scalable spin qubit architectures prior to fabrication.