Quantum sensing and imaging assisted by machine learning

Alexandra E. Boltasseva

Single photon emitters represent a critical component for enabling several quantum technologies such as quantum communication, quantum photonic computing, sensing, and imaging. One example of quantum imaging that leverages the non-classical nature of light radiated by quantum emitters is the so-called antibunching super-resolution microscopy. We present a machine learning (ML)-assisted approach for the realization of rapid antibunching super-resolution imaging and demonstrate 12 times speed-up compared to conventional, fitting-based autocorrelation measurements. The developed framework paves the way to the practical realization of scalable quantum on-chip devices hosting various types of quantum emitters as well as quantum material metrology. Additionally, for security applications, we develop a robust, ML-assisted on-chip device testing method that can be used to ensure the integrity of a chip avoiding risks of tampering and failure. Both ML approaches could pave the way to the realization of large-scale, secure quantum on-chip devices.

Edoardo Charbon A

Alejandro Perdomo‐Ortiz

Leonardo Tomazeli Duarte, Yannick Deville

Motivated by the potential performance gains offered by quantum computing (QC), a recent research focus — known as quantum-assisted machine learning (QAML) — aims to develop machine learning algorithms tailored for execution on quantum computers while processing data that originate from a classical (i.e. non-quantum) phenomenon. QAML has been studied in various quantum computing (QC) paradigms. This paper, in particular, offers a brief overview of QAML within the context of adiabatic quantum computing (AQC). The major challenge in this case is to reformulate the machine learning task as a quadratic unconstrained binary optimization (QUBO) problem, which lies at the core of existing AQC physical implementations. We provide examples of machine learning techniques tailored to AQC, along with applications in remote sensing.

Aaron D. Tranter, Ludwik Kranz, Sam Sutherland +4 more

Donor-based qubits in silicon, manufactured using scanning tunneling microscope (STM) lithography, provide a promising route to realizing full-scale quantum computing architectures. This is due to the precision of donor placement, long coherence times, and scalability of the silicon material platform. The properties of multiatom quantum dot qubits, however, depend on the exact number and location of the donor atoms within the quantum dots. In this work, we develop machine learning techniques that allow accurate and real-time prediction of the donor number at the qubit site during STM patterning. Machine learning image recognition is used to determine the probability distribution of donor numbers at the qubit site directly from STM images during device manufacturing. Models in excess of 90% accuracy are found to be consistently achieved by mitigating overfitting through reduced model complexity, image preprocessing, data augmentation, and examination of the intermediate layers of the convolutional neural networks. The results presented in this paper constitute an important milestone in automating the manufacture of atom-based qubits for computation and sensing applications.

A. S. Wilson