Quantum phase imaging enables the analysis of transparent samples with thickness and refractive index variations in scenarios requiring precise measurements under low-light conditions. Here, we present a compact quantum phase-gradient imaging system integrating a lithium niobate (LiNbO3) metasurface for generating spatially entangled photon pairs and a silicon (Si) metasurface for phase gradient extraction. By leveraging nonlocal resonances, the LiNbO3 metasurface enables efficient spontaneous parametric down-conversion (SPDC) with all-optically angularly tunable emission, while the Si metasurface provides a nearly linear optical transfer function (OTF) that differentiates the photon wavefunction and extracts phase gradients.Experimental proof-of-concept results demonstrate the imaging of up to 25~rad/mm phase gradients, achieving 89% similarity with the reference values. The pixel resolution of the system can be potentially enhanced by orders of magnitude by increasing the metasurface dimensions and resonance quality factor.Our work showcases the application of metasurfaces in both generating and detecting quantum states and establishes a new paradigm for portable quantum phase-gradient imaging, with potential applications in quantum sensing, microscopy, and LiDAR technology.Quantum phase imaging enables the analysis of transparent samples with thickness and refractive index variations in scenarios requiring precise measurements under low-light conditions. Here, we present a compact quantum phase-gradient imaging system integrating a lithium niobate (LiNbO3) metasurface for generating spatially entangled photon pairs and a silicon (Si) metasurface for phase gradient extraction. By leveraging nonlocal resonances, the LiNbO3 metasurface enables efficient spontaneous parametric down-conversion (SPDC) with all-optically angularly tunable emission, while the Si metasurface provides a nearly linear optical transfer function (OTF) that differentiates the photon wavefunction and extracts phase gradients.Experimental proof-of-concept results demonstrate the imaging of up to 25~rad/mm phase gradients, achieving 89% similarity with the reference values. The pixel resolution of the system can be potentially enhanced by orders of magnitude by increasing the metasurface dimensions and resonance quality factor.Our work showcases the application of metasurfaces in both generating and detecting quantum states and establishes a new paradigm for portable quantum phase-gradient imaging, with potential applications in quantum sensing, microscopy, and LiDAR technology.

physics.opticsCross-listedarXiv:2511.09922OpticaNov 14, 20251 citation

Quantum-enhanced microscopy with binary-outcome photon counting

Guangri Jin, Wen Yang, C. P. Sun

Polarized light microscopy using path-entangled $N$ -photon states (i.e., the N00N states) has been demonstrated to surpass the shot-noise limit at very low light illumination. However, the microscopy images suffer from divergence of phase sensitivity, which inevitably reduces the image quality. Here we show that due to experimental imperfections, such a singularity also takes place in the microscopy that uses twin-Fock states of light for illumination. We propose two schemes to completely eliminate this singularity: (i) locking the phase shift sensed by the beams at the optimal working point using a spatially dependent offset phase; (ii) a combination of two binary-outcome photon counting measurements, one with a fixed offset phase and the other without any offset phase. Our observations remain valid for any kind of binary-outcome measurement and may open the way for quantum-enhanced microscopy with high $N$ photon states.Polarized light microscopy using path-entangled $N$-photon states (i.e., the N00N states) has been demonstrated to surpass the shot-noise limit at very low light illumination. However, the microscopy images suffer from divergence of phase sensitivity, which inevitably reduces the image quality. Here we show that due to experimental imperfections, such a singularity also takes place in the microscopy that uses twin-Fock states of light for illumination. We propose two schemes to completely eliminate this singularity: (i) locking the phase shift sensed by the beams at the optimal working point using a spatially dependent offset phase; (ii) a combination of two binary-outcome photon counting measurements, one with a fixed offset phase and the other without any offset phase. Our observations remain valid for any kind of binary-outcome measurement and may open the way for quantum-enhanced microscopy with high $N$ photon states.

arXiv:1606.03267Physical Review AJan 23, 201717 citations

Nonlinear microscopy with squeezed light

Alex Terrasson

Mar 22, 20240 citations

Optical Phase Measurement Using Entangled Photons

Ryo Okamato, Shigeki Takeuchi

光学Oct 10, 20130 citations

Polarized light microscopy using path-entangled

N

-photon states (i.e., the N00N states) has been demonstrated to surpass the shot-noise limit at very low light illumination. However, the microscopy images suffer from divergence of phase sensitivity, which inevitably reduces the image quality. Here we show that due to experimental imperfections, such a singularity also takes place in the microscopy that uses twin-Fock states of light for illumination. We propose two schemes to completely eliminate this singularity: (i) locking the phase shift sensed by the beams at the optimal working point using a spatially dependent offset phase; (ii) a combination of two binary-outcome photon counting measurements, one with a fixed offset phase and the other without any offset phase. Our observations remain valid for any kind of binary-outcome measurement and may open the way for quantum-enhanced microscopy with high

N

photon states.