Robust Arbitrary Single Qubit Gates for NV Centers: Low-Field or High-Frequency Regimes
López García, Alberto, Cerrillo Moreno, Javier
Abstract
Microwave control of the negatively charged nitrogen-vacancy (NV) defect in diamond is usually based on a two-level approximation of its ground state that is only valid in the regime of high bias magnetic fields or low microwave power. We present the NV-ERC technique, which has demonstrated efficient initialization and readout of the double quantum transition with no leakage to any third level, thanks to an effective Raman coupling. The protocol may be used in the low-field regime and for high-frequency sensing. Furthermore, we propose a scheme to perform fast single-qubit gates in the double quantum transition, consisting of pulse trains of constant frequency and intensity. We analyze its robustness with respect to pulse-timing errors resulting from inaccurate identification of system parameters or phase-control limitations. We also demonstrate that the technique can be implemented in the presence of unknown electric or strain fields.