IEEE Optoelectronics Global Conference (OGC)
Characterization of Solitons Using Hong-Ou-Mandel Interference
Ji Liu, Yunru Fan, Yong Geng, Hai‐Zhi Song, You Wang, Hao Li, Lixing You, Heng Zhou, Kun Qiu, Guang‐Can Guo, Qiang Zhou
Abstract
We demonstrate the characterization of two- and three-soliton generated in microring resonator (MRR) using the Hong-Ou-Mandel (HOM) interference. In the experiment, the multi-soliton pulses are input into a HOM interferometer, and the coincidence counts are recorded with respect to the relative time delay. Our results provide a new approach for investigating temporal properties of MRR-based frequency combs.