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Chaos Solitons & Fractals

Multi-parameter estimation in critical quantum metrology

Giovanni Di Fresco, Bernardo Spagnolo, Davide Valenti, Angelo C. M. Carollo

Published Aug 1, 2025• 0 citations
Publisher

Abstract

Quantum metrology leverages the unique properties of quantum systems to enhance parameter estimation beyond classical limits. In this short review, we introduce the core concepts of quantum metrology, with a particular focus on its extension to multi-parameter estimation. We begin by outlining the foundational principles of quantum metrology and explore how quantum criticality can enhance measurement precision — especially near quantum phase transitions, where systems exhibit heightened sensitivity to external perturbations. Next, we consider the framework of multi-parameter quantum critical metrology, in which the simultaneous estimation of multiple parameters near criticality can lead to further improvements in accuracy. Finally, we discuss measurement-induced phase transitions, a phenomenon emerging in the context of continuous quantum measurements that introduces non-Hermitian dynamics and fundamentally alters the system’s behavior. This review provides a concise overview of these key developments and highlights their significance for future progress in quantum sensing technologies.

DOI
10.1016/j.chaos.2025.116913

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Quantum metrology leverages the unique properties of quantum systems to enhance parameter estimation beyond classical limits. In this short review, we introduce the core concepts of quantum metrology, with a particular focus on its extension to multi-parameter estimation. We begin by outlining the foundational principles of quantum metrology and explore how quantum criticality can enhance measurement precision — especially near quantum phase transitions, where systems exhibit heightened sensitivity to external perturbations. Next, we consider the framework of multi-parameter quantum critical metrology, in which the simultaneous estimation of multiple parameters near criticality can lead to further improvements in accuracy. Finally, we discuss measurement-induced phase transitions, a phenomenon emerging in the context of continuous quantum measurements that introduces non-Hermitian dynamics and fundamentally alters the system’s behavior. This review provides a concise overview of these key developments and highlights their significance for future progress in quantum sensing technologies.
Quantum phenomena offer the possibility of measuring physical quantities with precision beyond classical limits. However, current progress is constrained by scalability, environmental noise, and challenges in practical integration. This highlights the necessity for novel approaches. An emerging paradigm in this direction is , which harnesses the enhanced susceptibility and nonclassical correlations that naturally occur near quantum phase transitions as resources for quantum-enhanced precision. This tutorial provides a pedagogical introduction to key concepts and a detailed overview of prominent quantum sensing strategies that exploit critical phenomena in metrology. Through examples of increasing complexity, the reader is guided through various critical quantum sensing protocols applied to different critical systems. Special emphasis is placed on the optimal scaling of estimation precision with respect to fundamental resources. Finally, we discuss how critical quantum metrology extends from idealized models to realistic open-system, dissipative regimes, and strongly correlated fermionic systems, outlining both the challenges and opportunities for future quantum technologies.
Critical quantum metrology exploits the hypersensitivity of quantum systems near phase transitions to achieve enhanced precision in parameter estimation. While single-parameter estimation near critical points is well established, the simultaneous estimation of multiple parameters, which is essential for practical sensing applications, remains challenging. This difficulty arises from sloppiness, a phenomenon that typically renders the quantum Fisher information matrix (QFIM) singular or nearly singular. In this work, we demonstrate that multiparameter critical metrology is not only feasible but can also retain divergent precision scaling, provided one accepts a trade-off in the scaling exponent. Using the ground state of the single-cavity Dicke model (DM), we show that two Hamiltonian parameters can be simultaneously estimated with a scalar variance bound scaling as the square root of the critical parameter. This overcomes the inherent sloppiness by leveraging higher-order contributions to the QFIM. To recover the optimal quadratic scaling, we introduce the Dicke dimer (DD) with photon hopping. In this extended model, a triple point in the phase diagram enables the simultaneous closure of two excitation gaps, which effectively increases the rank of the QFIM and restores the ideal single-parameter scaling for specific parameter pairs. Furthermore, we extend our analysis to dissipative settings subject to photon loss. Finally, we establish a connection between the derived critical scalings and the fundamental state preparation time, providing a unified framework to operationally compare different sensing strategies. Our results demonstrate that critical quantum metrology can be made robust against dissipation and scalable to multiparameter scenarios, paving the way for practical quantum sensors operating near phase transitions.
Recent years have witnessed a growing interest in understating the limitations imposed by quantum noise in precision measurements and devising techniques to reduce it. The attention is currently turning to the simultaneously estimation of several parameters of interest, driven by its promising potential across a wide range of sensing applications as well as fueled by experimental progress in various optical and atomic platforms. Here, we provide a comprehensive overview of key research directions in multiparameter quantum sensing and metrology, highlighting both opportunities and challenges. We introduce the basic framework, discuss ultimate sensitivity bounds, optimal measurement strategies, and the role of quantum incompatibility, showing important differences with respect to single-parameter estimation. Additionally, we discuss emerging experimental implementations in distributed quantum sensing, including cutting-edge optimization techniques. This review aims to bridge the gap between theory and experiments, paving the way for the next-generation of quantum sensors and their integration with other quantum technologies.
Quantum metrology aims to enhance measurement precision beyond the classical limit by leveraging quantum resources. Unlike multi-parameter dynamic quantum metrology, many questions regarding multiparameter quantum metrology at thermal equilibrium remain elusive. In particular, the ultimate precision limits achievable in this equilibrium setting are not yet well understood. In this work, we examine the fundamental limits of estimating multiple parameters with a quantum probe at thermal equilibrium. We first show that the Heisenberg limit with respect to the number of probes can be achieved, and our bound coincides with the known single-parameter bound when only one parameter is estimated. We then consider the low temperature limit, revealing a qualitatively different behavior compared to the finite temperature case. We give an example to illustrate the usage of our main results. Finally, we show the conditions under which the sensitivity bound can be attained and the optimal measurements to achieve it.
Critical quantum metrology relies on the extreme sensitivity of a system's eigenstates near the critical point of a quantum phase transition to Hamiltonian perturbations. This means that these eigenstates are extremely sensitive to all the parameters of the Hamiltonian. In realistic settings, there is always some degree of uncertainty in the control parameters used to tune the system to criticality. These uncertainties, while not the target of estimation, can significantly affect the attainable precision, effectively acting as nuisance parameters in the estimation process. Despite being a practically relevant source of noise, their impact on critical metrology has been largely overlooked. In this work we present a general framework that interpolates between single- and multiparameter estimation settings, enabling a systematic analysis of how such uncertainties influence sensitivity. We apply this framework to the paradigmatic transverse field Ising and Lipkin-Meshkov-Glick models, explicitly demonstrating how uncertainty in control parameters affects the metrological performance of critical sensors. For finite-size systems, we identify a fundamental trade-off between robustness to uncertainty and the ability to retain a quantum advantage at the critical point. Our results contribute to a deeper understanding of the practical limitations of critical quantum metrology and provide a route toward its more resilient implementation.