IEEE Conference on Decision and Control (CDC)
Simultaneous quantum state and detector tomography through multiple Hamiltonians
Shuixin Xiao, Weichao Liang, Yuanlong Wang, Daoyi Dong, Ian R. Petersen, Valery Ugrinovskii
Abstract
The estimation of all the parameters in an unknown quantum state/measurement device, commonly referred to as quantum state/detector tomography (QST/QDT), plays a pivotal role in characterization and control of quantum systems. In this paper, we introduce a novel method to concurrently identify a quantum state and a detector using multiple Hamiltonians. We then develop two solutions, i.e., a closed-form algorithm and the sum of squares (SOS) optimization. The numerical examples demonstrate that the closed-form solution offers computational efficiency, while the SOS optimization method ensures accuracy.