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British and Irish Conference on Optics and Photonics (BICOP)

Characterisation of Mode Field Diameter for “Quantum-Grade” Interconnects

R. A. Ferguson, J. Felix, Simon Hall

Published Jan 1, 2023• 0 citations
Publisher

Abstract

The paper describes the characterization of “quantum-grade” interconnects using Mode Field Diameter as a figure of merit. We discuss the metrology needs for Quantum Network interconnects, supporting the development of commercially relevant traceable standards.
DOI
10.1364/bicop.2023.th4b.4

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