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European Microwave Conference (EuMC)

Characterising Scattering Parameters of Coaxial Microwave Devices at Milli-kelvin Temperatures for Quantum Computing Technologies

Manoj Stanley, Sang-Hee Shin, James Skinner, Jonas Urbonas, Nick Ridler

Published Sep 19, 2023• 8 citations
Publisher

Abstract

Quantum computing technologies utilise microwave components and interfaces at cryogenic temperatures during operation. This paper describes an S-parameter measurement system to characterise coaxial microwave devices at temperatures down to tens of milli-kelvin. The measurement system is calibrated using a Thru-reflect-line technique utilising a coaxial air-dielectric transmission line as the reference impedance standard. Various coaxial microwave devices having a wide range of reflection and transmission coefficient values are measured at both room temperature and mK temperature to investigate the calibration performance and understand the various error sources in the measurements.

DOI
10.23919/eumc58039.2023.10290560

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IEEE Transactions on Instrumentation and Measurement•Jan 1, 2025•3 citations
Quantum computing technologies utilise microwave components and interfaces at cryogenic temperatures during operation. This paper describes an S-parameter measurement system to characterise coaxial microwave devices at temperatures down to tens of milli-kelvin. The measurement system is calibrated using a Thru-reflect-line technique utilising a coaxial air-dielectric transmission line as the reference impedance standard. Various coaxial microwave devices having a wide range of reflection and transmission coefficient values are measured at both room temperature and mK temperature to investigate the calibration performance and understand the various error sources in the measurements.
Development of RF and microwave metrology capabilities at cryogenic temperatures is critical for the development of high-performance microwave devices to facilitate commercialization of cryogenic quantum technologies. This article presents a broadband microwave S-parameter calibration scheme suitable for cryogenic environments operating at temperatures down to tens of milli-kelvin (mK). The technique is based on a weighted multi-line thru-reflect-line (TRL) calibration approach and is demonstrated using coaxial air line calibration standards. One-and two-port microwave devices commonly used in cryogenic quantum computing applications, a cryogenic 50 Ω~\Omega Ωmatched load and a cryogenic 6 dB attenuator, were measured. The measured results at mK temperatures indicate that when combined with calibration standards of appropriate electrical length, the weighted multi-line TRL calibration scheme allows broadband frequency coverage compared to conventional TRL calibration schemes utilizing a single line standard. The mechanical and electrical properties of the line standards at mK temperatures were investigated and discussed. These findings establish the feasibility of utilizing multiple off-the-shelf coaxial air lines to enhance the frequency range of calibrations at mK temperatures.
Accurate S-parameter characterization of coaxial microwave devices and interfaces at milli-kelvin (mK) temperatures is essential for building high performance quantum computing systems. Coaxial air-dielectric transmission lines (air lines) are used routinely as primary reference standards for S-parameter measurements at room temperature. For the first time, the feasibility of utilizing such air lines as primary reference standards at mK temperatures is investigated. However, for air lines to be used at such temperatures, they must first be characterized accurately in terms of their characteristic impedance and propagation constant. This paper describes techniques for characterizing air lines at both room temperature (taken here to be 296 K) and mK temperature (around 25 mK). The measurement results demonstrate the feasibility of using air lines as primary reference standards at mK temperatures.
Abstract Techniques to precisely characterise RF components at milli‐Kelvin temperatures support the development of quantum computing systems utilising these components. In this work, an S‐parameter measurement setup to characterise RF integrated circuits at milli‐Kelvin temperatures has been proposed and for the first time, the S‐parameter measurements at milli‐Kelvin temperatures have been validated using two independent calibration techniques, thereby providing more confidence in measurements. The techniques are demonstrated experimentally by comparing and validating calibrated S‐parameter measurements of a cryogenic attenuator integrated circuits at milli‐Kelvin temperatures.
Designing large-scale superconducting quantum circuits involves complex microwave engineering to minimize loss, spurious reflections, and signal crosstalk. Essential for engineering more complex circuits is precise knowledge of devices’ microwave performance, which can be characterized by measuring its calibrated scattering parameters (S-parameters) at mK temperatures. In this work, we introduce a full 2-port calibrated S-parameter measurement setup which can characterize superconducting quantum integrated circuits and other RF integrated circuits operating at mK temperatures. The design and architecture of the measurement system consisting of in-house developed microwave calibration unit (MCU) housing the newly designed cryogenic calibration standards and the device under test (DUT) is discussed in detail. The measurement setup is then used to demonstrate the first calibrated S-parameter measurements of an in-house developed superconducting qubit integrated circuit at mK temperature.
We report calibrated microwave transmission and reflection measurements of a qubit sample holder at millikelvin temperatures. The methodology we present extends our previous work on one-port cryogenic short-open-load (SOL) calibration to a two-port SOLT measurement by implementing an unknown thru (T) standard. We report the resulting calibrated transmission and reflection at millikelvin temperatures through a printed circuit board that is installed into the sample holder. Finally, we consider a cascade of components at the end of a qubit drive line that includes (1) a cryogenic attenuator, (2) a coaxial cable, and (3) a qubit sample holder. Using experimentally determined parameters for return losses for all three components, we calculate the negligible state-preparation error in the frequency band of 5-7 GHz due to control pulse distortions arising from reflection at the coaxial launches. Taken together, our results highlight the utility of calibrated cryogenic scattering parameter measurements for the validation of qubit packaging and the wiring in its immediate vicinity.
Recent developments in microwave-based quantum computing technologies have motivated the need for the development of new and improved cryogenic microwave devices packaged in coaxial connectorized technology, and for their performance to be accurately characterized through S-parameter measurements made at cryogenic operating temperatures. To facilitate such accurate characterization, S-parameter measurement systems utilizing in-situ calibration techniques at cryogenic temperatures have been developed. This required use of cryogenic RF switches inside cryostats to select between calibration standards and devices to perform calibration and measurement in a single cooling cycle. However, this caused significant measurement errors due to non-identical signal paths due to differences in switch paths limiting the measurement accuracy of such measurement systems. In this work, a new technique is proposed to significantly improve the accuracy of cryogenic S-parameter measurements of coaxial connectorized devices by accounting for non-ideal effects in such switch-based cryogenic calibration units. The technique is demonstrated at room temperature (296 K) and cryogenic temperature (1.5 K) through S-parameter measurements of coaxial devices with up to two ports.