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International Conference on Computing, Electronics & Communications Engineering (iCCECE)

Advances in Optical Metrology: The Impact of Deep Learning and Quantum Photonics

Rea Bitri, Maaruf Ali

Published Aug 14, 2023• 1 citation
Publisher

Abstract

There have been numerous advances in the fields of engineering, medicine, environment and so forth that involve measurements as a critical part of research and applications. Especially, when it comes to reaching efficient and precision measurements - what comes in handy are optical sensors that provide results beyond just size or location. In recent years, research have primarily relied on providing solutions by using deep learning and novel training algorithms for efficiently determining and eliciting results in the fields that optical metrology is applied. However, there is also analysed optical quantum metrology that is bringing a new finding to light. This paper will analyse the impact of deep learning in quantum metrology and will provide future suggestions on how to improve the results in terms of classical means by using the technologies of quantum photonics metrology to provide actual examples and applications of both technologies in real life.

DOI
10.1109/iccece59400.2023.10238502

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