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Automatic Generation of Testing Circuits for Deterministic Quantum Algorithms

Antonio García de la Barrera, Manuel Serrano, Ignacio García‐Rodríguez de Guzmán, Macario Polo Usaola, Mario G. Piattini

Published Jan 1, 2023• 1 citation
Publisher
DOI
10.2139/ssrn.4421955

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Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This article alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques that can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by (1) theoretical guarantees under reasonable conditions and (2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV), and Bernstein-Vazirani (BV) in IBM Qiskit.
Quantum computing is an exciting new field in the intersection of computer science, physics and mathematics. It refines the central concepts from Quantum mechanics into its least difficult structures, peeling away the complications from the physical world. Any combinational circuit that has only one stuck at fault can be tested by applying a set of inputs that drive the circuit to verify the output response. The outputs of that circuit will be different from the one desired if the faults exist. This project describes a method of generating test patterns using the Boolean satisfaction method. First, the Boolean formula is constructed to express the Boolean difference between a fault-free circuit and a faulty circuit. Second, the Boolean satisfaction algorithm is applied to the formula in the previous step. The Grover algorithm is used to solve the Boolean satisfaction problem. The Boolean Satisfiability problem for Automatic Test Pattern Generation(ATPG) is implemented on IBM Quantum Experience. The Python program initially generates the boolean expression from the file and converts it into Conjunctive Normal Form(CNF) which is passed on to Grover Oracle and runs on IBM simulator and produces excellent results on combinational circuits for test pattern generation with a quadratic speedup. Grover’s Algorithm on this problem has a run time of O(√N).