International Conference on Ultrafast Phenomena
Increase in Exciton Radiative Lifetime in GaAs Quantum Wells at High Exciton Density due to Exciton-Exciton Scattering
R. Eccleston, B. F. Feuerbacher, J. Kühl, Wolfgang W. Rühle, Klaus Ploog
Abstract
We report time-resolved photoluminescence (TRPL) measurements of the radiative lifetime (τr) at 1.8K of resonantly excited heavy-hole excitons in a 27nm GaAs single quantum well as a function of exciton density. By the use of AlAs interface smoothing layers [1], the sample exhibits very little inhomogeneous broadening (≈0.15meV). The exciton centre of mass motion is therefore not significantly restricted by localisation in well width fluctuation islands. However, measurements of the exciton homogeneous linewidth (Γ h ) using time-resolved degenerate four wave mixing in the self-diffraction configuration (Fig.1) [2], additionally show that the sample imperfection scattering contribution to the Γ h of these delocalised excitons is also small (0.2meV). Thus, as indicated by the dependence of Γ h on exciton density (N x ), even at moderate exciton densities, exciton-exciton scattering is the dominant dephasing interaction within the photocreated exciton ensemble.