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Resonance fluorescence studies of spectroscopically pure SiO2

Fuat Bayrakçeken, Yaman, Ali, Behzad B. Jomehri

Published Sep 30, 2000• 0 citations
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Abstract

Yeditepe University, Department of Electric and Electronics Engineering, Uskudar 81160, Istanbul, Turkey Ankara University, Faculty of Sciences, Department of Physics, Tandogan, 06100 Ankara, Turkey E-mail : ayaman@science.ankara.edu.tr Ankara University, Faculty of Sciences, Department of Engineering Physics, 06100 Tandogan, Ankara, Tui key Manuscript received 6 March 2000, revised 5 June 2000, accepted 8 June 2000 Resonance fluorescence has been observed for spectroscopically pure SiO2, at 288.2 nm by high power optical pumping, using flash photolysis technique. Absorption and emission bands are recorded photographically in the UV-region. Absorption and emission bands are observed without fine structure at room temperature.

DOI
10.5281/zenodo.5870613

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Yeditepe University, Department of Electric and Electronics Engineering, Uskudar 81160, Istanbul, Turkey Ankara University, Faculty of Sciences, Department of Physics, Tandogan, 06100 Ankara, Turkey E-mail : ayaman@science.ankara.edu.tr Ankara University, Faculty of Sciences, Department of Engineering Physics, 06100 Tandogan, Ankara, Tui key Manuscript received 6 March 2000, revised 5 June 2000, accepted 8 June 2000 Resonance fluorescence has been observed for spectroscopically pure SiO2, at 288.2 nm by high power optical pumping, using flash photolysis technique. Absorption and emission bands are recorded photographically in the UV-region. Absorption and emission bands are observed without fine structure at room temperature.
Spectroscopically pure fused silica has been used in many applications ranging from optoelectronics and optical fibers to laser flash spectroscopy. Although ultraviolet light irradiated optical absorption spectra and coherence fluorescence of silicon dioxide have been studied in the past, we present discrete absorption and resonance coherent fluorescence line of silicon dioxide which were recorded photographically at 288.2 nm. This discrete fluorescence is observed at room temperature using high photon flux (1024photon/pulse) excitation spectroscopy.
Ozan S. Sariyer, Michael Hinczewski, and A. Nihat Berker Department of Physics, Koc University, Sariyer 34450, Istanbul, Turkey, Feza Gursey Research Institute, TUBITAK Bosphorus University, Cengelkoy 34680, Istanbul, Turkey, Department of Physics, Technical University of Munich, Garching 85748, Germany Faculty of Engineering and Natural Sciences, Sabanci University, Orhanli, Tuzla 34956, Istanbul, Turkey, and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, U.S.A.
J. H. Pixley,1,2 Tathagata Chowdhury,3 M. T. Miecnikowski,3,4,* Jaimie Stephens,3,5 Christopher Wagner,3 and Kevin Ingersent3 1Condensed Matter Theory Center and the Joint Quantum Institute, Department of Physics, University of Maryland, College Park, Maryland 20742-4111, USA 2Department of Physics and Astronomy, Rice University, Houston, Texas 77005, USA 3Department of Physics, University of Florida, Gainesville, Florida 32611-8440, USA 4Department of Applied Physics and Applied Mathematics, Columbia University, 500 W. 120th St., Mudd 200, MC 4701 New York, New York 10027, USA 5Department of Physical and Environmental Sciences, Colorado Mesa University, Grand Junction, Colorado 81501-3122, USA (Received 15 March 2015; revised manuscript received 15 May 2015; published 10 June 2015)