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Imaging and Applied Optics

High resolution Hong-Ou-Mandel microscope for depth imaging

Cyril Torre, Alex McMillan, Jonathan C. F. Matthews

Published Jan 1, 2022• 0 citations
Publisher

Abstract

We demonstrate the use of Hong-Ou-Mandel interference to resolve < 10µm scale depth-features of a semi-transparent sample and incorporate confocal imaging for 3D microscopy using photons from a wavelength-entangled pair photon source.
DOI
10.1364/isa.2022.ith5d.1

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The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-colour entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-μmμmμm precision is reported using up to 12.3 nm12.3~nm12.3 nm of detuning and ∼104\sim10^4∼104 detected photon pairs.
Sub-μm\mu\mathrm{m}μm Axial Precision Depth Imaging with Entangled Two-Colour Hong-Ou-Mandel Microscopy
Hong-Ou-Mandel (HOM) interference results in a modified probability of bunching events when indistinguishable photons with a relative timing offset interact at a beamsplitter. Lyons et al. recently achieved attosecond precision in time delay measurement by applying a classical Fisher information analysis to HOM interference [1]. More recently an increase in the measurement precision has been shown by detuning the central wavelengths of the signal and idler from an entangled two-colour photon pair source and applied in temperature drift detection for optical fibres [2]. Here we exploit the timing resolution of the HOM interference to implement a robust 3D imaging microscope with tuneable sensitivity from millimetre to sub-micrometre.
Hong-Ou-Mandel (HOM) interference, i.e. the bunching of indistinguishable photons at a beam splitter is a staple of quantum optics and lies at the heart of many quantum sensing approaches and recent optical quantum computers. Although originally proposed as a method for sensing micron-scale variations in photon propagation path lengths and despite the detection of photon bunching using camera technologies, the technique is still to be extended to the imaging domain. We report a full-field, scan-free, quantum imaging technique that exploits HOM interference to reconstruct the surface depth profile of transparent samples. We measure both the bunched and anti-bunched photon-pair distributions at the HOM interferometer output which are combined to provide a lower-noise image of the sample. This approach demonstrates the possibility of HOM microscopy as a tool for label-free imaging of transparent samples in the very low photon regime.