International Conference on Electronic Packaging Technology (ICEPT)
Chip-Scale SERF Atomic Magnetometer Realized by Virtual Lock-in Amplifier
Gong Sun, Jintang Shang, Junming Wu, Jin Zhang, Wenqi Li, Jinfeng Zhang
Abstract
This paper presents a new design of a chip-scale atomic magnetometer based on Spin Exchange Relaxation Free (SERF) mechanism, which can easily expand the measurement channels. The lock-in amplifier used to detect the photoelectric signal is realized by the data acquisition board and the virtual instrument based on LabVIEW, which can extract the information of the signal from the input whose signal-to-noise ratio is not lower than 30dB. In order to ensure that the sensor works in the weak magnetic environment, the compensation curves in Y and Z directions are theoretically analyzed and experimentally verified. After completing the magnetic compensation, this system realizes the simultaneous acquisition of two photodiode signals, and the sensitivity of single channel magnetometer reaches 440 fT/√Hz at 20Hz. This paper provides a scheme for realizing the multi-channel atomic magnetometer.