Effect of Two Level System Saturation on Charge Noise in Josephson\n Junction Qubits
Clare C. Yu, Magdalena Constantin, John M. Martinis
Abstract
We show that charge noise $S_Q$ in Josephson qubits can be produced by\nfluctuating two level systems (TLS) with electric dipole moments in the\nsubstrate using a flat density of states. At high frequencies the frequency and\ntemperature dependence of the charge noise depends on the ratio $J/J_c$ of the\nelectromagnetic flux $J$ to the critical flux $J_c$. It is not widely\nappreciated that TLS in small qubits can easily be strongly saturated with\n$J/J_c\\gg 1$. Our results are consistent with experimental conclusions that\n$S_Q\\sim 1/f$ at low frequencies and $S_Q\\sim f$ at high frequencies.