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Conference on Lasers and Electro-Optics

Atomic wave-meter on-chip

Eitan Edrei, Elam Gerstel, Shani Gamzu-Letova, Noa Mazurski, Uriel Levy

Published Jan 1, 2022• 1 citation
Publisher

Abstract

We demonstrate a wave-meter on chip device with accurate calibration and enhanced robustness against environmental fluctuations enabled by the integration of atomic vapor with a photonic chip and the use of machine learning classification algorithm.
DOI
10.1364/cleo_si.2022.sth4h.6

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The quest for miniaturized optical wave-meters and spectrometers has accelerated the design of novel approaches in the field. Particularly, random spectrometers (RS) using the one-to-one correlation between the wavelength and an output random interference pattern emerged as a promising tool combining high spectral resolution and cost-effectiveness. Recently, a chip-scale platform for RS has been demonstrated with a markedly reduced footprint. Yet, despite the evident advantages of such modalities, they are very susceptible to environmental fluctuations and require an external calibration process. To address these challenges, we demonstrate a paradigm shift in the field, enabled by the integration of atomic vapor with a photonic chip and the use of a machine learning classification algorithm. Our approach provides a random wave-meter on chip device with accurate calibration and enhanced robustness against environmental fluctuations. The demonstrated device is expected to pave the way toward fully integrated spectrometers advancing the field of silicon photonics.
Photonic integrated circuits offer a compact and stable platform for generating, manipulating, and detecting light. They are instrumental for classical and quantum applications. Imperfections stemming from fabrication constraints, tolerances and operation wavelength impose limitations on the accuracy and thus utility of current photonic integrated devices. Mitigating these imperfections typically necessitates a model of the underlying physical structure and the estimation of parameters that are challenging to access. Direct solutions are currently lacking for mesh configurations extending beyond trivial cases. We introduce a scalable and innovative method to characterize photonic chips through an iterative machine learning-assisted procedure. Our method is based on a clear-box approach that harnesses a fully modeled virtual replica of the photonic chip to characterize. The process is sample-efficient and can be carried out with a continuous-wave laser and powermeters. The model estimates individual passive phases, crosstalk, beamsplitter reflectivity values and relative input/output losses. Building upon the accurate characterization results, we mitigate imperfections to enable enhanced control over the device. We validate our characterization and imperfection mitigation methods on a 12-mode Clements-interferometer equipped with 126 phase shifters, achieving beyond state-of-the-art chip control with an average 99.77 % amplitude fidelity on 100 implemented Haar-random unitary matrices.
Photonic integrated circuits offer a compact and stable platform for generating, manipulating, and detecting light. They are instrumental for classical and quantum applications. Imperfections stemming from fabrication constraints, tolerances, and operation wavelength impose limitations on the accuracy and thus utility of current photonic integrated devices. Mitigating these imperfections typically necessitates a model of the underlying physical structure and the estimation of parameters that are challenging to access. Direct solutions are currently lacking for mesh configurations extending beyond trivial cases. We introduce a scalable and innovative method to characterize photonic chips through an iterative machine learning-assisted procedure. Our method is based on a clear-box approach that harnesses a fully modeled virtual replica of the photonic chip to characterize. The process is sample-efficient and can be carried out with a continuous-wave laser and powermeters. The model estimates individual passive phases, crosstalk, beamsplitter reflectivity values, and relative input/output losses. Building upon the accurate characterization results, we mitigate imperfections to enable enhanced control over the device. We validate our characterization and imperfection mitigation methods on a 12-mode Clements-interferometer equipped with 126 phase shifters, achieving beyond state-of-the-art chip control with an average 99.77% amplitude fidelity on 100 implemented Haar-random unitary matrices.