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Nature Physics

The expanding role of National Metrology Institutes in the quantum era

Alexander Ya. Tzalenchuk, Nicolas Spethmann, Timothy J. Prior, Jay H. Hendricks, Yijie Pan, Vladimir Bubanja, Guilherme P. Temporão, Dai-Hyuk Yu, Damir Ilić, Barbara L. Goldstein

Published Jul 1, 2022• 12 citations
Publisher
DOI
10.1038/s41567-022-01659-z

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The design, fabrication, and the characterization of a 0.5-V Josephson junction array device are presented for the quantum voltage standards in the National Institute of Metrology (NIM) of China. The device consists of four junction arrays, each of which has 1200 3-stacked Nb/Nb x Si1−x /Nb junctions and an on-chip superconducting microwave circuit which is mainly a power divider enabling each Josephson array being loaded with an equal amount of microwave power. A direct current (dc) quantum voltage of about 0.5 V with a ∼1-mA current margin of the 1st quantum voltage step is obtained. To further prove the quality of NIM device, a comparison between the NIM device with the National Institute of Standards and Technology (NIST) programmable Josephson voltage standard (PJVS) system device is conducted. The difference of the reproduced 0.5-V quantum voltage between the two devices is about 0.55 nV, which indicates good agreement between the two devices. With the homemade device, we have realized a precise and applicable 0.5-V applicable-level quantum voltage.

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Emerging technologies demand innovations in metrology: • Agility – to keep pace with a rapidly changing technical landscape; • Ability – to develop novel, perhaps first-ever, measurement capabilities; • Comparability and interoperability – across vendors, in commercial timeframes; • Accelerated delivery – because formal standards may be obsolete by the time they’re published. The same quantum technologies that have revolutionized metrology, such as Josephson junctions that are used to create the world’s most accurate voltage standards and ion traps that are used in time and frequency standards, also underpin emerging new markets in quantum computing, networking and sensing – and these quantum-based products require entirely new approaches for measurement and characterization. The world’s metrology institutes have been at the forefront of the quantum revolution, being both early developers and adopters of quantum technologies for metrology, and are uniquely poised to spearhead the development of metrology for quantum – those measurements and related standards needed by industry to underpin quantum-based products. The metrology community is positioned to create trust in the emerging quantum economy due to its long history of objectivity, neutrality and international collaboration; anticipating industry’s needs to be ready with rigorous measurement capabilities as technologies evolve; and its having formed institutions such as the CIPM, BIPM and IMEKO to support collaborative efforts. The BIPM hosted a workshop in March 2024 which brought together 149 participants from 43 NMIs and designated institutes (DIs) from 39 economies, along with industry representatives, to discuss how best to leverage the expertise of the worlds national metrology institutes (NMIs) and their designated institutes (DIs) to accelerate the development and adoption of quantum technologies through measurements and standards. The workshop supported coordinated development and sharing of measurement “best practices” in support of future standardization, the mission of a new collaborative initiative referred to as NMI-Q. The NMI-Q organizing committee, comprised of representatives of the NMIs of Australia, Canada, Germany, Italy, Japan, the United Kingdom, and the United States, are working on a cooperation framework inspired by the successful VAMAS organization, which conducts coordinated pre-standardization work in material science. NMI-Q has initiated early work in quantum photonics, and expects to expand to a breadth of technical areas, such as measurement and characterization to support multiple quantum computing platforms, quantum networking models, and sensing modalities.
The design, fabrication, and the characterization of a 0.5-V Josephson junction array device are presented for the quantum voltage standards in the National Institute of Metrology (NIM) of China. The device consists of four junction arrays, each of which has 1200 3-stacked Nb/Nb x Si1−x /Nb junctions and an on-chip superconducting microwave circuit which is mainly a power divider enabling each Josephson array being loaded with an equal amount of microwave power. A direct current (dc) quantum voltage of about 0.5 V with a ∼1-mA current margin of the 1st quantum voltage step is obtained. To further prove the quality of NIM device, a comparison between the NIM device with the National Institute of Standards and Technology (NIST) programmable Josephson voltage standard (PJVS) system device is conducted. The difference of the reproduced 0.5-V quantum voltage between the two devices is about 0.55 nV, which indicates good agreement between the two devices. With the homemade device, we have realized a precise and applicable 0.5-V applicable-level quantum voltage.