Static to Dynamic Double Slit/Cross-Double Slit Experiments ---Straight Pattern to Curved-Expanded-Inclined Pattern
Peng, Hui
Abstract
In this article, we show three novel universal phenomena of the double slit, cross-double slit and grating experiments: (1) the patterns can curve; (2) the patterns can expand; and (3) the patterns created by the tilt double slits can curved, expanded, and inclined to the axis that is perpendicular to the axis the diaphragm rotates around (“Pattern” stands for both “interference” and “diffraction patterns”). The directions of the patterns curved towards are determined by how the diaphragm rotates, i.e., clockwise (CW) or counterclockwise (CCW). To determine the directions, we proposed Right-hand rule and Left-hand rule. The magnitudes of three phenomena depend on the direction of the rotation and two angles: the original angle of the double slit on the diaphragm relative to the rotation axis and the angle the diaphragm rotates. We derived the formular to calculate the expansion of the patterns, and the formular to calculate the inclination angle of patterns. In the regular double slit experiment, photons only need to know whether there is a double slit or not. Now, photons need to know much more: (1) the orientation of the double slit; (2) which axis the diaphragm rotating around; (3) the direction of rotation, i.e., CW or CCW; (4) the angle of the rotation. The Feynman’s mystery of the double slit is more mysterious.