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Springer eBooks

Low-Frequency Noise as a Source of Dephasing of a Qubit

Y. M. Galperin, B. L. Altshuler, D. V. Shantsev

Published Jan 1, 2004• 6 citations
Publisher
DOI
10.1007/978-1-4020-2812-0_9

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Low -Frequency 1/F Noise: Low Temperature Measurements and Effect on Superconducting Qubit Dephasing

Trevis A. Crane

Low-frequency noise caused by critical-current fluctuations in Josephson junctions can lead to substantial, measurement-induced dephasing in superconducting qubits. The purpose of this work is to measure this noise as a function of temperature and to simulate its effect on the measurement dynamics associated with superconducting qubits. In Nb trilayer junctions we measure the noise power at 1 Hz down to 10 mK and verify a T2 dependence for T > 1 K, below which we observe a flattening of the noise magnitude versus temperature. In Al trilayer junctions we measure the critical-current noise power at 1 Hz from 10 mK to 1.4 K and find no dependence on temperature over this range. Possible reasons for the deviation from a T2 dependence are explored, including heating and sample quality. Simulations of the effect of 1/f noise are performed to examine the consequence of using different qubit sampling methods on expected dephasing times. Using the two sampling methods, we can probe the spectral nature and possible source of the dominant noise in a qubit.

•Jan 1, 2005•0 citations
We study the effects of correlated low-frequency noise sources acting on a two-qubit gate in a fixed coupling scheme. A decoherence model for the spatial and cross-talk correlations is introduced. The efficiency inside the SWAP subspace is analyzed by combining analytic results based on the adiabatic approximation and numerical simulations. Results critically depend on amplitude of the low-frequency noise with respect to the qubits' coupling strength. Correlations between noise sources induce different qualitative behavior depending on the values of the above parameters. The possibility to reduce dephasing due to correlated low-frequency noise by a recalibration protocol is discussed.
Low-frequency noise caused by critical-current fluctuations in Josephson junctions can lead to substantial, measurement-induced dephasing in superconducting qubits. The purpose of this work is to measure this noise as a function of temperature and to simulate its effect on the measurement dynamics associated with superconducting qubits. In Nb trilayer junctions we measure the noise power at 1 Hz down to 10 mK and verify a T2 dependence for T > 1 K, below which we observe a flattening of the noise magnitude versus temperature. In Al trilayer junctions we measure the critical-current noise power at 1 Hz from 10 mK to 1.4 K and find no dependence on temperature over this range. Possible reasons for the deviation from a T2 dependence are explored, including heating and sample quality. Simulations of the effect of 1/f noise are performed to examine the consequence of using different qubit sampling methods on expected dephasing times. Using the two sampling methods, we can probe the spectral nature and possible source of the dominant noise in a qubit.