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Partial randomized benchmarking and noise

Kirill S. Dubovitskii, Yuriy Makhlin

Published Nov 7, 2021• 0 citations
OpenAlex

Abstract

In practical randomized benchmarking of logical gates for quantum computation, partial averaging is sometimes used to simplify the implementation. For instance, for two-qubit gates, averaging over only single-qubit operations is much easier to realize than the full averaging. We analyze such simplified, partial averaging and demonstrate that, unlike for the standard randomized benchmarking, the measured decay law of fidelity is a linear combination of several exponentials with different decay factors (3 for two qubits and single-bit averaging). The evolution with the sequence length is given by an iteration matrix, whose eigenvalues give the decay factors. For generic two-qubit gates two contributions decay fast and are barely visible, while the third factor characterizes a combination of gate errors in three channels. While the decay factor of this slowest exponential is close to that in the standard randomized benchmarking, we demonstrate that they differ in general and find this correction to the leading order. Furthermore, via a connection to the local invariants of two-qubit gates we find all exceptional gates, with more than one slow exponential, and analyze possibilities to extract their decay factors from the measured curves.

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Quantum computers have the potential to bring about a new age of technology, but in order for them to become a reality, the elephant in the room must be addressed, quantum errors. The complexity of quantum errors grows exponentially as the system size is increased; scalable characterization protocols which work under physically realistic noise are therefore needed to assess and optimize control. \n \nRandomized Benchmarking (RB) is a family of characterization protocols with the requisite qualities. RB protocols are independent of state preparation and measurement (SPAM) errors, and because they extract partial information about the error profiles in the form of figures of merit, they are scalable in the number of qubits. In this thesis, we study these figures of merit under various error models, gate-sets, and sample distributions, to further our understanding of their physical meaning, and to fine-tune the best practice for diagnosing errors in basic gate-sets. \n \nThe first study presented in this thesis looks at the physical meaning of the unitarity under physically realistic gate-dependent noise. Numerically, we demonstrate that under these realistic noise models, the unitarity obtained via Extended RB (XRB) overlaps strongly with the average of the unitarity of the errors over the set of individual operations. \n \nThe second study numerically and analytically proves that the Standard RB (SRB) decay parameter p coincides with the decay parameter of the novel figure of merit gate-set circuit fidelity. We also prove that, in the limit of high-fidelity single-qubit experiments, the disconnect between the average gate fidelity and SRB experimental results is caused by a basis mismatch between the gates and the state-preparation and measurement procedures. \n \nIn the third part of this thesis, we compare the results of two variations of the SRB protocol, one that samples uniformly (SRB) and one that samples non-uniformly (NIST RB) from the Clifford group. We prove that NIST RB produces an exponential fidelity curve that gives different infidelity results than SRB. \n \nThe fourth and final study gives a standard for assessing basic gate-sets. Experimental results are given from the assessment run on super-conducting and ion-trap devices. We also experimentally show how the systematic error bounds can be tightened by accounting for the error's degree of coherence, as well as using weaker randomizing sets.

•Jul 9, 2021•0 citations
In practical randomized benchmarking of logical gates for quantum computation, partial averaging is sometimes used to simplify the implementation. For instance, for two-qubit gates, averaging over only single-qubit operations is much easier to realize than the full averaging. We analyze such simplified, partial averaging and demonstrate that, unlike for the standard randomized benchmarking, the measured decay law of fidelity is a linear combination of several exponentials with different decay factors (3 for two qubits and single-bit averaging). The evolution with the sequence length is given by an iteration matrix, whose eigenvalues give the decay factors. For generic two-qubit gates two contributions decay fast and are barely visible, while the third factor characterizes a combination of gate errors in three channels. While the decay factor of this slowest exponential is close to that in the standard randomized benchmarking, we demonstrate that they differ in general and find this correction to the leading order. Furthermore, via a connection to the local invariants of two-qubit gates we find all exceptional gates, with more than one slow exponential, and analyze possibilities to extract their decay factors from the measured curves.
In randomized benchmarking of quantum logical gates, partial twirling can be used for simpler implementation, better scaling, and higher accuracy and reliability. For instance, for two-qubit gates, single-qubit twirling is easier to realize than full averaging. We analyze such simplified, partial twirling and demonstrate that, unlike for the standard randomized benchmarking, the measured decay of fidelity is a linear combination of exponentials with different decay rates (3 for two qubits and single-bit twirling). The evolution with the sequence length is governed by an iteration matrix, whose spectrum gives the decay rates. For generic two-qubit gates one slowest exponential dominates and characterizes gate errors in three channels. Its decay rate is close, but different from that in the standard randomized benchmarking, and we find the leading correction. Using relations to the local invariants of two-qubit gates we identify all exceptional gates with several slow exponentials and analyze possibilities to extract their decay rates from the measured curves.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.
Randomized benchmarking is routinely used as an efficient method for characterizing the performance of sets of elementary logic gates in small quantum devices. In the measurement-based model of quantum computation, logic gates are implemented via single-site measurements on a fixed universal resource state. Here we adapt the randomized benchmarking protocol for a single qubit to a linear cluster state computation, which provides partial, yet efficient characterization of the noise associated with the target gate set. Applying randomized benchmarking to measurement-based quantum computation exhibits an interesting interplay between the inherent randomness associated with logic gates in the measurement-based model and the random gate sequences used in benchmarking. We consider two different approaches: the first makes use of the standard single-qubit Clifford group, while the second uses recently introduced (non-Clifford) measurement-based 2-designs, which harness inherent randomness to implement gate sequences.
Randomized benchmarking (RB) is an efficient and robust method to characterize gate errors in quantum circuits. Averaging over random sequences of gates leads to estimates of gate errors in terms of the average fidelity. These estimates are isolated from the state preparation and measurement errors that plague other methods such as channel tomography and direct fidelity estimation. A decisive factor in the feasibility of randomized benchmarking is the number of sampled sequences required to obtain rigorous confidence intervals. Previous bounds were either prohibitively loose or required the number of sampled sequences to scale exponentially with the number of qubits in order to obtain a fixed confidence interval at a fixed error rate. Here, we show that, with a small adaptation to the randomized benchmarking procedure, the number of sampled sequences required for a fixed confidence interval is dramatically smaller than could previously be justified. In particular, we show that the number of sampled sequences required is essentially independent of the number of qubits and scales favorably with the average error rate of the system under investigation. We also investigate the fitting procedure inherent to randomized benchmarking in light of our results and find that standard methods such as ordinary least squares optimization can give misleading results. We therefore recommend moving to more sophisticated fitting methods such as iteratively reweighted least squares optimization. Our results bring rigorous randomized benchmarking on systems with many qubits into the realm of experimental feasibility.
Randomized benchmarking (RB) returns a single decay parameter or gate error rate, but when the noise is gate-dependent that parameter is notoriously difficult to interpret. We study RB and related random-circuit benchmarks under small gate-local Markovian noise by factorizing each noisy gate into its ideal action followed by the exponential of a small error generator and then perturbing the RB L\mathscr{L}L matrix, which models the RB decay. For any low-error gate set that satisfies the requirements of RB (it is a sequence-asymptotic unitary 2-design), we show that Pauli-stochastic error rates contribute linearly to the RB decay parameter, while Hamiltonian error rates contribute through a gauge-invariant quadratic form. Pauli-correlation and active generators are absent from the linear term and enter only at higher order. For the single-qubit native gate set {Xπ/2,Yπ/2}\{X_{π/2},Y_{π/2}\}{Xπ/2​,Yπ/2​} we derive this quadratic form explicitly in terms of three first-order gauge-invariant (FOGI) coordinates: the two intrinsic over-rotations and one relational axis-tilt error. The resulting formula explains the dependence of DRB on the sampling distribution and the compilation dependence of CRB. These results turn RB decay rates into interpretable functions of experimentally meaningful elementary error rates.
Quantum computers have the potential to bring about a new age of technology, but in order for them to become a reality, the elephant in the room must be addressed, quantum errors. The complexity of quantum errors grows exponentially as the system size is increased; scalable characterization protocols which work under physically realistic noise are therefore needed to assess and optimize control. \n \nRandomized Benchmarking (RB) is a family of characterization protocols with the requisite qualities. RB protocols are independent of state preparation and measurement (SPAM) errors, and because they extract partial information about the error profiles in the form of figures of merit, they are scalable in the number of qubits. In this thesis, we study these figures of merit under various error models, gate-sets, and sample distributions, to further our understanding of their physical meaning, and to fine-tune the best practice for diagnosing errors in basic gate-sets. \n \nThe first study presented in this thesis looks at the physical meaning of the unitarity under physically realistic gate-dependent noise. Numerically, we demonstrate that under these realistic noise models, the unitarity obtained via Extended RB (XRB) overlaps strongly with the average of the unitarity of the errors over the set of individual operations. \n \nThe second study numerically and analytically proves that the Standard RB (SRB) decay parameter p coincides with the decay parameter of the novel figure of merit gate-set circuit fidelity. We also prove that, in the limit of high-fidelity single-qubit experiments, the disconnect between the average gate fidelity and SRB experimental results is caused by a basis mismatch between the gates and the state-preparation and measurement procedures. \n \nIn the third part of this thesis, we compare the results of two variations of the SRB protocol, one that samples uniformly (SRB) and one that samples non-uniformly (NIST RB) from the Clifford group. We prove that NIST RB produces an exponential fidelity curve that gives different infidelity results than SRB. \n \nThe fourth and final study gives a standard for assessing basic gate-sets. Experimental results are given from the assessment run on super-conducting and ion-trap devices. We also experimentally show how the systematic error bounds can be tightened by accounting for the error's degree of coherence, as well as using weaker randomizing sets.