Correlated qubit errors are a hinderance to quantum computing, but when using quantum chips as a particle detector, they can be a sign of energy deposits. Using a four transmon qubit chip in the NEXUS fridge at Fermilab, we have taken data to better understand the impact ionizing radiation has on the correlated errors. To analyze this data, we need a jump detection code that is robustly tested with understood efficiencies. In this work, we describe the process of getting these efficiencies using a rolling
χ2 jump detection code.
We measure the effect of ionizing radiation on superconducting qubits with a timing resolution of 1
μs using microwave kinetic inductance detectors (MKIDs) fabricated on the same substrate. We observe no correlation between two-level system (TLS) scrambling events and ionizing radiation events detected with the MKIDs, suggesting TLS scrambling events may not arise from ionizing radiation and instead the previously reported apparent correlation may be due to events without sufficient energy to trigger our MKIDs. We characterize the fast-time system recovery of transmons following a radiation event, where we observe the recovery of the enhanced qubit relaxation and excitation to be well-described by an exponential recovery to the baseline quasiparticle density, with a characteristic time of
13±1 μs, and a peak quasiparticle density at the junction per deposited energy of
240/μm3/MeV. The fast recovery is consistent with literature reported values for Nb-based devices with direct injection of 2
ΔAl phonons, demonstrating the recovery is strongly dependent on the proximity of niobium to the junction.