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Physics of the Solid State

Cross-relaxational decay of electronic excitation energy from the G 7/2 level of the Nd ion in crystalline LaF 3

Tasoltan T. Basiev, Yu.V. Orlovskii, Yu. S. Privis

Published Apr 1, 1996• 0 citations
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Trapping of optical excitation by two types of acceptors in La0.72 Pr0.25 Nd0.03 F3

Thomas J. Glynn, I. Laulicht, Liren Lou +2 more

We have investigated the process of quenching of fluorescence from the $^{3}P_{0}$ state of ${\mathrm{Pr}}^{3+}$ in ${\mathrm{La}}_{0.72}$${\mathrm{Pr}}_{0.25}$${\mathrm{Nd}}_{0.03}$${\mathrm{F}}_{3}$ due to cross relaxation to Pr and Nd ions. The fluorescence decay of the ensemble of Pr ions after pulsed excitation is measured as a function of temperature in the (2-70)-K region. Cross relaxation occurs either directly or through a donor-donor transfer within the inhom-geneous line. Knowledge of the dynamics occurring within the inhomogeneous line derived from previous fluorescence line-narrowing experiments is used to analyze the cross-relaxation process from a microscopic viewpoint according to models for fluorescence decay in the presence of traps. In general the decay is consistent with an electric dipole-dipole transfer mechanism. At 2 K the decay can be well described by a direct transfer to Pr and Nd traps without donor-donor transfer. The temperature dependence of the decay at long times can be described for $35<T<70$ K by the hopping model. The agreement with theory is much better if the cross relaxation to Nd ions is assumed to occur mainly via the lowest Stark level of the $^{4}I_{\frac{9}{2}}$ manifold.

Physical review. B, Condensed matter•May 1, 1984•9 citations

Near-threshold excitation of the λ132.2 nm resonance line of the Tl+ ion by electron impact

Г. М. Гомонай, V Roman, Л. О. Бандуріна +3 more

Background : Among all processes of collision of electrons with atomic particles the study of the interaction between electrons and ions is extremely important and necessary for a better understanding of the basic collisional processes in plasma. In the processes of excitation, recombination, and ionization of ions by electron impact autoionization states play an important role. Their radiation decay makes an additional contribution to the photo-recombination process and leads to dielectronic recombination of an ion. Such contribution is most significant in the case of heavy many-electron ions such as the Tl + ion. Excitation of the Tl + ion by an electron impact at electron-ion collisions is practically not investigated up to date. Methods: Experiments were performed using a spectroscopic method in conditions of electron and ion beams intersecting at an angle of 90°. The ribbon electron beam (cross section 1×8 mm 2 , energy E e = 6–14 eV, current I e = (2–10)×10 –5 A) was formed by a low-energy three-electrode electron gun. The ion beam (cross section 2.5×2.5 mm 2 , energy E i = 800 eV, current I i = (5–7)×10 –7 A) was obtained using a low-voltage arc discharge source. The radiation due to decay of the ion states excited during the collisions was detected perpendicular to the plane of the beams intersection. Spectral separation of the radiation in a vacuum ultraviolet region was carried out by 70° vacuum monochromator based on the Seya-Namioka scheme. Results: Thorough measurements of the near-threshold region of the energy dependence of the effective cross section of the electron excitation of the resonance l 132.2 nm line (6 s 6 p 1 P o 1 → 6 s 2 1 S 0 ) of the Tl + ion in the 6–14 eV energy range revealed resonant features both after and before the excitation threshold of the line. The widths of the before-threshold peculiarities is defined by the dispersion of the excited electrons energy. This is indicative of their resonant nature, i.e., they are due to the formation and decay of the atoionization states (AIS) of the Tl atom. Most likely, they are related to the formation and decay of the AIS of the 6 s 6 pnp configuration ( n  ≥ 7) to the excited levels of the Tl atom. The nature of the after-threshold structure indicates that it is also the result of resonance processes and is due to the formation and decay of the AIS, most likely of the 5 d  9 6 s 2 6 p 2 configuration, in the electronic channel. The absolute values of the excitation cross sections of the dielectronic satellites were determined by comparison of their intensities with the intensity of the resonance l 132.2 nm line which effective excitation cross section was obtained by normalizing the experimental data on the theoretical calculation by the tight-binding method of two states of the excitation cross section of the 6 s 6 p  1 P o 1 level of the Tl + ion at the 100 eV energy. Conclusions: The energy dependence of the effective excitation cross section of the dielectronic satellites of the Tl + ion resonance line showed that the absolute values of their excitation cross sections are ~ 10 –16 cm 2 and are of the same order of magnitude with that for the resonance line. It is shown that the main excitation mechanism of the resonance line satellites is dielectronic recombination which effectiveness essentially depends on the ratio of the probabilities of the AIS radiation and electron decay. In the case of the relativistic Tl + ion a strong configuration mixing of levels leads to significant increase of the AIS radiation decay probability.

Scientific Herald of Uzhhorod University Series Physics•Dec 31, 2018•0 citations
We have investigated the process of quenching of fluorescence from the 3P0^{3}P_{0}3P0​ state of Pr3+{\mathrm{Pr}}^{3+}Pr3+ in La0.72{\mathrm{La}}_{0.72}La0.72​Pr0.25{\mathrm{Pr}}_{0.25}Pr0.25​Nd0.03{\mathrm{Nd}}_{0.03}Nd0.03​F3{\mathrm{F}}_{3}F3​ due to cross relaxation to Pr and Nd ions. The fluorescence decay of the ensemble of Pr ions after pulsed excitation is measured as a function of temperature in the (2-70)-K region. Cross relaxation occurs either directly or through a donor-donor transfer within the inhom-geneous line. Knowledge of the dynamics occurring within the inhomogeneous line derived from previous fluorescence line-narrowing experiments is used to analyze the cross-relaxation process from a microscopic viewpoint according to models for fluorescence decay in the presence of traps. In general the decay is consistent with an electric dipole-dipole transfer mechanism. At 2 K the decay can be well described by a direct transfer to Pr and Nd traps without donor-donor transfer. The temperature dependence of the decay at long times can be described for 35<T<7035<T<7035<T<70 K by the hopping model. The agreement with theory is much better if the cross relaxation to Nd ions is assumed to occur mainly via the lowest Stark level of the 4I92^{4}I_{\frac{9}{2}}4I29​​ manifold.
Background : Among all processes of collision of electrons with atomic particles the study of the interaction between electrons and ions is extremely important and necessary for a better understanding of the basic collisional processes in plasma. In the processes of excitation, recombination, and ionization of ions by electron impact autoionization states play an important role. Their radiation decay makes an additional contribution to the photo-recombination process and leads to dielectronic recombination of an ion. Such contribution is most significant in the case of heavy many-electron ions such as the Tl + ion. Excitation of the Tl + ion by an electron impact at electron-ion collisions is practically not investigated up to date. Methods: Experiments were performed using a spectroscopic method in conditions of electron and ion beams intersecting at an angle of 90°. The ribbon electron beam (cross section 1×8 mm 2 , energy E e = 6–14 eV, current I e = (2–10)×10 –5 A) was formed by a low-energy three-electrode electron gun. The ion beam (cross section 2.5×2.5 mm 2 , energy E i = 800 eV, current I i = (5–7)×10 –7 A) was obtained using a low-voltage arc discharge source. The radiation due to decay of the ion states excited during the collisions was detected perpendicular to the plane of the beams intersection. Spectral separation of the radiation in a vacuum ultraviolet region was carried out by 70° vacuum monochromator based on the Seya-Namioka scheme. Results: Thorough measurements of the near-threshold region of the energy dependence of the effective cross section of the electron excitation of the resonance l 132.2 nm line (6 s 6 p 1 P o 1 → 6 s 2 1 S 0 ) of the Tl + ion in the 6–14 eV energy range revealed resonant features both after and before the excitation threshold of the line. The widths of the before-threshold peculiarities is defined by the dispersion of the excited electrons energy. This is indicative of their resonant nature, i.e., they are due to the formation and decay of the atoionization states (AIS) of the Tl atom. Most likely, they are related to the formation and decay of the AIS of the 6 s 6 pnp configuration ( n  ≥ 7) to the excited levels of the Tl atom. The nature of the after-threshold structure indicates that it is also the result of resonance processes and is due to the formation and decay of the AIS, most likely of the 5 d  9 6 s 2 6 p 2 configuration, in the electronic channel. The absolute values of the excitation cross sections of the dielectronic satellites were determined by comparison of their intensities with the intensity of the resonance l 132.2 nm line which effective excitation cross section was obtained by normalizing the experimental data on the theoretical calculation by the tight-binding method of two states of the excitation cross section of the 6 s 6 p  1 P o 1 level of the Tl + ion at the 100 eV energy. Conclusions: The energy dependence of the effective excitation cross section of the dielectronic satellites of the Tl + ion resonance line showed that the absolute values of their excitation cross sections are ~ 10 –16 cm 2 and are of the same order of magnitude with that for the resonance line. It is shown that the main excitation mechanism of the resonance line satellites is dielectronic recombination which effectiveness essentially depends on the ratio of the probabilities of the AIS radiation and electron decay. In the case of the relativistic Tl + ion a strong configuration mixing of levels leads to significant increase of the AIS radiation decay probability.