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Topical Meeting on Optical Bistability (OB)

Simulations of the Dynamics of Optical Bistability with Fluctuations.

Stephan W. Koch, Hartmut Schmidt, H. Haug

Published Jan 1, 1983• 0 citations
Publisher

Abstract

The Langevin-equation (1) for the fluctuating light-field E in a nonlinear semiconductor resonator has been derived in Ref.[1]: All quantities are dimensionless, εi being proportional to the amplitude of the incoming field, κ is a damping constant, ω" is the ratio of imaginary and real part of the dielectric function and Δ is proportional to the detuning. The additive term f(τ) is the classical noise source representing a Gauss-Markov process. The staionary properties of eq.(1) have been investigated in Ref.[1] and the details of optical bistable operation has been determined.

DOI
10.1364/obi.1983.thb22

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The Langevin-equation (1) for the fluctuating light-field E in a nonlinear semiconductor resonator has been derived in Ref.[1]: All quantities are dimensionless, εi being proportional to the amplitude of the incoming field, κ is a damping constant, ω" is the ratio of imaginary and real part of the dielectric function and Δ is proportional to the detuning. The additive term f(τ) is the classical noise source representing a Gauss-Markov process. The staionary properties of eq.(1) have been investigated in Ref.[1] and the details of optical bistable operation has been determined.
We formulate a running wave, singlemode model for purely dispersive optical bistability, which incorporates amplitude and frequency fluctuations in the incident field, cavity length fluctuations, thermal noise in the radiation field and in the material (1). This model is given by a set of three Langevin-type equations for the real and the imaginary part of the slowly-varying electric field, and for the material variable. In the white noise limit, it is equivalent to a Fokker-Planck equation in three variables. Even if our model can describe also a Kerr medium or a two-level system in a suitable range of parameters, we are mainly interested in the case of miniaturized all–optical bistable devices which utilize semiconductor dispersive media. In this situation, we can adiabatically eliminate the field variables and therefore reduce the problem to a single stochastic differential equation in one variable, which contains several terms of additive and multiplicative noise. We find that noise in the imaginary part of the slowly varying electric field does not contribute to this equation. In the white, -noise case, our stochastic equation is equivalent to a Fokker-Planck equation in one variable, whereas in the case of colored noise we obtain a onedimensional Fokker-Planck equation only in the limit of short correlation times.
We formulate a running-wave, single-mode model for purely dispersive optical bistability that incorporates amplitude and frequency fluctuations in the incident-field, cavity-length fluctuations, and thermal noise in the radiation field and in the material. This model is given by a set of three Langevin-type equations for the real and the imaginary parts of the slowly varying electric field and for the material variable. In the white-noise limit, it is equivalent to a Fokker–Planck equation in three variables. Even if our model can also describe a Kerr medium or a two-level system in a suitable range of parameters, we are interested mainly in the case of miniaturized all-optical bistable devices that utilize semiconductor dispersive media. In this situation, we can adiabatically eliminate the field variables and therefore reduce the problem to a single stochastic differential equation in one variable, which contains several terms of additive and multiplicative noise. We find that noise in the imaginary part of the slowly varying electric field does not contribute to this equation. In the white-noise case, our stochastic equation is equivalent to a Fokker–Planck equation in one variable, whereas in the case of colored noise we obtain a one-dimensional Fokker–Planck equation only in the limit of short correlation times. Finally, we calculate the stationary solution of the resulting Fokker–Planck equation. We show that the presence of colored noise narrows the peaks of the probability distribution at steady state with respect to the white-noise case.
A generalized Fokker-Planck equation is derived for a system undergoing optical bistability when the dominant source of fluctuations is due to fluctuations in the incident field rather than spontaneous emission. The fluctuations are treated as a time-dependent Gaussian process whose properties are determined by the individual laser's characteristics. Both amplitude and phase fluctuations are included on the incident laser field. The effect of fluctuations of the incident laser on optical bistability are different for amplitude and phase fluctuations and are different for absorptive and dispersive optical bistability. The combination of incident laser phase fluctuations and dispersive optical bistability leads to large amplitude fluctuations near the turning points of the optical bistability curve and causes the system to make a transition from one branch of the optical bistability curve to the other before reaching the mean-field turning points. We take the high-QQQ cavity limit of our generalized Fokker-Planck equation, solve the linearized equations, and provide criteria for the magnitude of fluctuations in optical bistability in terms of laser and cavity parameters. The magnitude of incident laser fluctuations are typically orders of magnitude larger than fluctuations due to spontaneous emission and are therefore important for practical applications of optical bistability devices.
In a recent paper (1) we formulated a running wave, singlemode model for purely dispersive optical bistability, which incorporates amplitude and frequency fluctuations in the incident field, cavity length fluctuations, thermal noise in the radiation field and in the material. In the bad-cavity case of miniaturized bistable devices which utilize semiconductor dispersive media, our model reduces to a single stochastic differential equation for the material variable, which contains several terms of additive and multiplicative noise. In the white-noise case, it is equivalent to a Fokker-Planck equation in one variable, whereas in the case of colored noise it is equivalent to a multidimensional Fokker-Planck equation. On the basis of this model, we examined both problem of practical (P) and of fundamental (F) interest.
The main purpose of this paper is to study the behavior of the atomic fluctuations and the spectrum of the light transmitted by an absorptive bistable device. To this end we develop an approximation scheme based on the so-called system-size expansion and apply it to the quantum-mechanical Langevin equations for the atomic fluctuation operators. The Bonifacio-Lugiato mean-field equations for bistability are derived from the lowest-order approximation to the system-size expansion, while the atomic correlation functions result from the next-higher-order expansion. The calculated spectrum of the transmitted light exhibits line narrowing near the bistable thresholds, discontinuous formation of sidebands along the high-transmission branch of the device, and hysteresis effects.
On the basis of the absorptive bistability model, including the fluctuations, we rederive in the good-cavity limit the Fokker-Planck equation describing the time evolution of the quasiprobability distribution for the transmitted field amplitude. It is shown that on a semiclassical level different variants of the Fokker-Planck equation are possible. The equation of Bonifacio, Gronchi, and Lugiato is solved in terms of a path integral which involves a generalized Wiener measure. In order to calculate the averages of transmitted field moments as functions of time, a Monte Carlo integration scheme is used. This scheme consists in constructing random trajectories which result from the Langevin equation statistically equivalent to the derived Fokker-Planck equation. Numerical results in the bistable domain are presented for large values of the fluctuation parameter.