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OSA Quantum 2.0 Conference

Machine Learning Assisted Quantum Photonics

Zhaxylyk A. Kudyshev, Simeon Bogdanov, Theodor Isacsson, Alexander V. Kildishev, Alexandra E. Boltasseva, Vladimir M. Shalaev

Published Jan 1, 2020• 0 citations
Publisher

Abstract

The characterization of single quantum emitters is a time-consuming process. We have demonstrated that machine learning methods can dramatically reduce data collection time(<1s), and increase measurement accuracy of second-order fluorescence autocorrelation(>90%).
DOI
10.1364/quantum.2020.qm6b.3

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One of the main characteristics of optical imaging systems is spatial resolution, which is restricted by the diffraction limit to approximately half the wavelength of the incident light. Along with the recently developed classical super-resolution techniques, which aim at breaking the diffraction limit in classical systems, there is a class of quantum super-resolution techniques which leverage the non-classical nature of the optical signals radiated by quantum emitters, the so-called antibunching super-resolution microscopy. This approach can ensure a factor of [Formula: see text] improvement in the spatial resolution by measuring the n -th order autocorrelation function. The main bottleneck of the antibunching super-resolution microscopy is the time-consuming acquisition of multi-photon event histograms. We present a machine learning-assisted approach for the realization of rapid antibunching super-resolution imaging and demonstrate 12 times speed-up compared to conventional, fitting-based autocorrelation measurements. The developed framework paves the way to the practical realization of scalable quantum super-resolution imaging devices that can be compatible with various types of quantum emitters.
Single photon emitters represent a critical component for enabling several quantum technologies such as quantum communication, quantum photonic computing, sensing, and imaging. One example of quantum imaging that leverages the non-classical nature of light radiated by quantum emitters is the so-called antibunching super-resolution microscopy. We present a machine learning (ML)-assisted approach for the realization of rapid antibunching super-resolution imaging and demonstrate 12 times speed-up compared to conventional, fitting-based autocorrelation measurements. The developed framework paves the way to the practical realization of scalable quantum on-chip devices hosting various types of quantum emitters as well as quantum material metrology. Additionally, for security applications, we develop a robust, ML-assisted on-chip device testing method that can be used to ensure the integrity of a chip avoiding risks of tampering and failure. Both ML approaches could pave the way to the realization of large-scale, secure quantum on-chip devices.