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AIP conference proceedings

High rate true random number generator using beta radiation

Kyung Hwan Park, Seong Mo Park, Byoung Gun Choi, Jong Bum Kim, Kwang Jae Son

Published Jan 1, 2020• 9 citations
Publisher

Abstract

This paper relates to a technique for generating true random numbers at high speed from the nuclear decay of beta radioisotopes. The true random number is obtained by detecting beta radiation from Ni-63 radioisotope which emits only pure beta particle. For high rate random number generation, the best specification on Ni-63 beta radiation source is introduced. Then, a high-sensitivity detection circuit that can detect the beta radiation and make short pulse will be briefly described. A series of pulses from the detection circuit are converted to random numbers. Finally, it is confirmed that the random number is a true random number by statistical analysis and the NIST 800-22 test.

DOI
10.1063/5.0031879

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This paper relates to a technique for generating true random numbers at high speed from the nuclear decay of beta radioisotopes. The true random number is obtained by detecting beta radiation from Ni-63 radioisotope which emits only pure beta particle. For high rate random number generation, the best specification on Ni-63 beta radiation source is introduced. Then, a high-sensitivity detection circuit that can detect the beta radiation and make short pulse will be briefly described. A series of pulses from the detection circuit are converted to random numbers. Finally, it is confirmed that the random number is a true random number by statistical analysis and the NIST 800-22 test.
Efficient and reliable Random Number Generator (RNG) are increasingly demanded in cryptographic applications, such as on-the-fly data encription/decription and as a general tool for data protection. Main requirement of RNG is a true randomness, which is achievable by means of physical randomness sources only. A True-RNG based on two independent Stochastic Processes (SP) is presented and discussed. As primary randomness sources, two radioactive decay processes are used. A radioactive source has many advantages over others noise sources, since the decay rate of any nuclide does not depend on temperature, chemical composition, physical state, environmental conditions, and aging. In addition, in U ore for example, the various nuclides are, at very good approximation, at equilibrium in the decay chain, so that many stationary independent SP's with the same statistics can be simply obtained by detecting and selectively routing, e.g. by pulse amplitude sorting, gamma rays of different energy emitted by different nuclides in the decay chain. Simulation is performed by a numerical code. The random bit stream obtained is tested for randomness by the NIST test suite, and results are shown. A hardware implementation of the system is also presented.
True random number generators, which output truly random numbers by extracting entropy from physical phenomena such as thermal and electronic noises, are widely used in the field of the cryptographic communication systems. We have been developing a superconductive true random number generator that can generate truly random number sequences, impossible to be predicted, by utilizing the high-speed operation and high-sensitivity of superconductive integrated circuits. In this study, we have calculated the dependences of correlation of output random bits on the generation rate. Statistical tests have been performed on the basis of the NIST statistical test suite in order to evaluate the quality of the randomness of sequences generated by the superconductive true random number generator at high generation rate. We have generated a random number sequence consisting of 3.2 M-bit at the generation rate of 30 Gbit/s using the superconductive true random number generator, fabricated by the ISTEC-SRL 2.5 kA/cm2Nb standard process. The generated random number sequences passed 13 kinds of the statistical tests in the NIST statistical test suit, although the 3 tests were not performed because of the shortage of the generated random numbers. The result sufficiently proves that a superconductive true random number generator can generate a high quality of random numbers that can be used for practical cryptographic applications, at a generation rate of up to 30 Gbit/s.
This paper presents a lightweight true random number generator (TRNG) using beta radiation that is useful for Internet of Things (IoT) security. In general, a random number generator (RNG) is required for all secure communication devices because random numbers are needed to generate encryption keys. Most RNGs are computer algorithms and use physical noise as their seed. However, it is difficult to obtain physical noise in small IoT devices. Since IoT security functions are required in almost all countries, IoT devices must be equipped with security algorithms that can pass the cryptographic module validation programs of each country. In this regard, it is very cumbersome to embed security algorithms, random number generation algorithms, and even physical noise sources in small IoT devices. Therefore, this paper introduces a lightweight TRNG comprising a thin-film beta-radiation source and integrated circuits (ICs). Although the ICs are currently being designed, the IC design was functionally verified at the board level. Our random numbers are output from a verification board and tested according to National Institute of Standards and Technology standards.
True random numbers with high security originate from non-deterministic physical processes. Random laser with random feedback arising from multiple elastic scattering in a highly disordered structure is an ideal physical entropy source theoretically. In this work, a secure optical ultrafast random number generator based on random laser spectra was demonstrated. Unlike the usual method of recording laser intensity over time, the random laser spectrum under each pump pulse was recorded and converted into random numbers through post-processing. Approaches in three different dimensions—space, spectrum and time were used to increase the rate of random number generation. The randomness of resulting random bit streams was verified by the NIST statistics tests. Experimental results showed that an instantaneous bit rate of 810 terabits per second with off-line post-processing could be theoretically reached with an ideal experimental condition. This novel technique has big advantages in secure communications and promises to further increase the speed of random number generators to the lever of petabits per second or even higher.
We propose what we believe to be a new approach to nondeterministic random-number generation. The randomness originated from the uncorrelated nature of consecutive laser pulses with Poissonian photon statistics and that of photon number detections is used to generate random bit, and the von Neumann correction method is used to extract the final random bit. This method is proved to be bias free in randomness generation, provided that the single photon detections are mutually independent. Further, it has the advantage in fast random bit generation, since no postprocessing is needed. A true random-number generator based on this method is realized, and its randomness is tested and guaranteed using three statistical test batteries.
True random number generators are essential for many applications including security and statistical simulations. A novel superconductive true random number generator is proposed based on inductor-less bistable Josephson junction circuits. The recently proposed design methodology, based on all-Josephson junctions, promises higher area efficiency and simpler circuit design. In this brief, this methodology is extended to a superconductive circuit design that extracts randomness from thermal noise present in electronic circuits. A high throughput of 16 GHz is achieved using the proposed design, with no bias or correlation in the output sequence. The quality of the generated randomness is assessed using NIST SP 800-22 statistical tests. A 100 Mb binary sequence is demonstrated to pass all 15 statistical tests using recommended parameters as per NIST guidelines. The simulation methodology, described in detail, is based on the MIT-LL SFQ5EE 10 kA/cm2 Nb standard process and open source Verilog-A model.