Entanglement between random and clean quantum spin chains
Róbert Juhász, István A. Kovács, Gergő Roósz, Ferenc Iglói
Abstract
The entanglement entropy in clean, as well as in random quantum spin chains has a logarithmic size-dependence at the critical point. Here, we study the entanglement of composite systems that consist of a clean and a random part, both being critical. In the composite, antiferromagnetic XX-chain with a sharp interface, the entropy is found to grow in a double-logarithmic fashion ${\cal S}\sim \ln\ln(L)$, where $L$ is the length of the chain. We have also considered an extended defect at the interface, where the disorder penetrates into the homogeneous region in such a way that the strength of disorder decays with the distance $l$ from the contact point as $\sim l^{-\kappa}$. For $\kappa<1/2$, the entropy scales as ${\cal S}(\kappa) \simeq (1-2\kappa){\cal S}(\kappa=0)$, while for $\kappa \ge 1/2$, when the extended interface defect is an irrelevant perturbation, we recover the double-logarithmic scaling. These results are explained through strong-disorder RG arguments.