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Journal of Experimental and Theoretical Physics

Interference effects in photodetachment and photoionization of atoms in a homogeneous electric field

I. I. Fabrikant

Published Dec 1, 1980• 5 citations
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The Aharonov–Bohm (AB) effect in the photodetachment microscopy of the H− ions in an electric field has been studied on the basis of the semiclassical theory. After the H− ion is irradiated by a laser light, they provide a coherent electron source. When the detached electron is accelerated by a uniform electric field, two trajectories of a detached electron which run from the source to the same point on the detector, will interfere with each other and lead to an interference pattern in the photodetachment microscopy. After the solenoid is electrified beside the H− ion, even though no Lorentz force acts on the electron outside the solenoid, the photodetachment microscopy interference pattern on the detector is changed with the variation in the magnetic flux enclosed by the solenoid. This is caused by the AB effect. Under certain conditions, the interference pattern reaches the macroscopic dimensions and could be observed in a direct AB effect experiment. Our study can provide some predictions for the future experimental study of the AB effect in the photodetachment microscopy of negative ions.

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Atomic interference in light fields

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A multichannel study of the photodetachment of a negative ion such as ${\mathrm{S}}^{\mathrm{\ensuremath{-}}}$ in the presence of a constant electric field is presented. The analysis is carried out as a series of frame transformations for the outgoing photoelectron. An earlier analysis in the absence of the external field is now augmented by the further transformations from spherical to cylindrical symmetry that are required. The interplay between the various thresholds due to fine structure in the negative ion and residual atom and the effects of the external field are analytically treated. The net effect is to eliminate the thresholds, to induce modulations in the detachment cross section, and to introduce field-assisted-tunneling contributions to the photodetachment. Numerical illustrations are provided. Our treatment closely parallels similar treatments of photoionization of neutral atoms in an electric field and of photodetachment in a magnetic field.
The Aharonov–Bohm (AB) effect in the photodetachment microscopy of the H− ions in an electric field has been studied on the basis of the semiclassical theory. After the H− ion is irradiated by a laser light, they provide a coherent electron source. When the detached electron is accelerated by a uniform electric field, two trajectories of a detached electron which run from the source to the same point on the detector, will interfere with each other and lead to an interference pattern in the photodetachment microscopy. After the solenoid is electrified beside the H− ion, even though no Lorentz force acts on the electron outside the solenoid, the photodetachment microscopy interference pattern on the detector is changed with the variation in the magnetic flux enclosed by the solenoid. This is caused by the AB effect. Under certain conditions, the interference pattern reaches the macroscopic dimensions and could be observed in a direct AB effect experiment. Our study can provide some predictions for the future experimental study of the AB effect in the photodetachment microscopy of negative ions.