Measurements of Lowest-S-State Lifetimes of Gallium, Indium, and Thalium
Michael Norton, Alan C. Gallagher
The lifetimes of the gallium $5^{2}S_{\frac{1}{2}}$ state, the indium $6^{2}S_{\frac{1}{2}}$ state, and the thallium $7^{2}S_{\frac{1}{2}}$ state were measured using the zero-field level-crossing (Hanle-effect) technique. The life-times obtained were (6.8\ifmmode\pm\else\textpm\fi{}0.3) \ifmmode\times\else\texttimes\fi{} ${10}^{\ensuremath{-}9}$, (7.0\ifmmode\pm\else\textpm\fi{}0.3) \ifmmode\times\else\texttimes\fi{} ${10}^{\ensuremath{-}9}$, and (7.45\ifmmode\pm\else\textpm\fi{}0.2) \ifmmode\times\else\texttimes\fi{} ${10}^{\ensuremath{-}9}$ sec, respectively. Anomalous contributions to the level-crossing signals, from the wavelength dependence of the exciting light intensity and self-absorption by the fluorescing atomic beam, were investigated in detail.
Physical Review A•Mar 1, 1971•34 citations